E. Pargon

1.4k citations
86 papers · 1.0k · h-index 18

Impact in

Papers in

    • Semiconductor materials and devices 39
    • Advancements in Photolithography Techniques 26
    • Integrated Circuits and Semiconductor Failure Analysis 20
    • Photonic and Optical Devices 13
    • Plasma Diagnostics and Applications 13
    • Advanced Surface Polishing Techniques 11

E. Pargon

84 papers receiving 1.0k citations

Peers

E. Pargon
Comparison fields: 5 of 42
  • Electrical and Electronic Engineering 883
  • Surfaces, Coatings and Films 79
  • Atomic and Molecular Physics, and Optics 289
  • Electronic, Optical and Magnetic Materials 115
  • Mechanics of Materials 143
Replace Camille Petit-Étienne with:
Camille Petit-Étienne France
M. Martin France
C. Gourgon France
Elmar Platzgummer Austria
Christophe Mihalcea United States
Soham Saha United States
Ségolène Callard France
Kwang Hong Lee Singapore
Karen Petrillo United States
E. Pargon relative to Camille Petit-Étienne France Camille Petit-Étienne's profile →
Citations per field
00.5×1.5×2.4×
Camille Petit-Étienne · 1×
Citations per year

Countries citing papers authored by E. Pargon

Since Specialization
Citations

This map shows the geographic impact of E. Pargon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Pargon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Pargon more than expected).

Fields of papers citing papers by E. Pargon

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. Pargon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Pargon. The network helps show where E. Pargon may publish in the future.

Co-authors

The 25 scholars most cited alongside E. Pargon, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with E. Pargon Line = papers co-authored together E. Pargon links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 86 papers — load more, or switch the sort, to bring in the rest.

#Work
1 201990
2 200964
3 200344
4 202343
5 201243
6 201342
7 200941
8 200839
9 201837
10 201228
11 201127
12 200526
13 200323
14 202022
15 202321
16 201919
17 201118
18 201917
19 201116
20 200816

About E. Pargon

E. Pargon is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials and Condensed Matter Physics, having authored 86 papers that have together received 1.0k indexed citations. Recurring topics across this work include Semiconductor materials and devices (39 papers), Advancements in Photolithography Techniques (26 papers), Integrated Circuits and Semiconductor Failure Analysis (20 papers), Photonic and Optical Devices (13 papers), Plasma Diagnostics and Applications (13 papers), Advanced Surface Polishing Techniques (11 papers), Metal and Thin Film Mechanics (10 papers) and GaN-based semiconductor devices and materials (10 papers). The work is most often cited by research in Electrical and Electronic Engineering (883 citations), Surfaces, Coatings and Films (79 citations), Atomic and Molecular Physics, and Optics (289 citations), Electronic, Optical and Magnetic Materials (115 citations) and Mechanics of Materials (143 citations). E. Pargon has collaborated with scholars based in France, Canada and United States. Frequent co-authors include O. Joubert, Camille Petit-Étienne, Marc Fouchier, K. Menguelti, Corrado Sciancalepore, M. Martin, Thorsten Lill, L. Vallier, J. Foucher and Houssein El Dirani. Their work appears in journals such as Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Journal of Applied Physics, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Microelectronic Engineering and Materials Science in Semiconductor Processing.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact