Jon Barth
Impact in
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- Electrostatic Discharge in Electronics
- Silicon Carbide Semiconductor Technologies
- Electromagnetic Compatibility and Measurements
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Electromagnetic Compatibility and Noise Suppression
- Radio Frequency Integrated Circuit Design
- Semiconductor materials and devices
Papers in
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- Electrostatic Discharge in Electronics 23
- Integrated Circuits and Semiconductor Failure Analysis 1
- Electromagnetic Compatibility and Noise Suppression 1
- Magnetic Field Sensors Techniques 1
- Co-authors
- Leo G. Henry (18 shared papers)Koen G. Verhaege (7 shared papers)Eugene R. Worley (2 shared papers)Horst A. Gieser (6 shared papers)J.T. Watt (1 shared paper)David Johannes Pommerenke (1 shared paper)George H. Weiss (1 shared paper)Steven H. Voldman (3 shared papers)
- Journals
- Microelectronics Reliability (4 papers)IEEE Transactions on Electronics Packaging Manufacturing (1 paper)Journal of Electrostatics (1 paper)IEEE Instrumentation & Measurement Magazine (1 paper)Electrical Overstress/Electrostatic Discharge Symposium (13 papers)
- Partner nations
- United StatesGermanyBelgium
In The Last Decade
Jon Barth
27 papers receiving 313 citations
Peers
Comparison fields: 5 of 14
- Electrical and Electronic Engineering 363
- Hardware and Architecture 3
- Safety, Risk, Reliability and Quality 3
- Aerospace Engineering 4
- Statistics, Probability and Uncertainty 1
Countries citing papers authored by Jon Barth
This map shows the geographic impact of Jon Barth's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jon Barth with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jon Barth more than expected).
Fields of papers citing papers by Jon Barth
This network shows the impact of papers produced by Jon Barth. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jon Barth. The network helps show where Jon Barth may publish in the future.
Co-authors
The 17 scholars most cited alongside Jon Barth, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 29 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 147 | |
| 2 | 2002 | 34 | |
| 3 | 2002 | 24 | |
| 4 | Standardization of the transmission line pulse (TLP) methodology for electrostatic discharge (ESD) | 2003 | 21 |
| 5 | 2003 | 20 | |
| 6 | Using VFTLP data to design for CDM robustness | 2009 | 20 |
| 7 | 2002 | 14 | |
| 8 | 2002 | 12 | |
| 9 | Voltages before and after current in HBM testers and real HBM | 2005 | 10 |
| 10 | HMM round robin study: What to expect when testing components to the IEC 61000-4-2 waveform | 2012 | 8 |
| 11 | 1998 | 6 | |
| 12 | Transmission-Line Pulse ESD Testing of ICs: A New | 2001 | 6 |
| 13 | Correlation considerations II: Real HBM to HBM testers | 2002 | 6 |
| 14 | 2003 | 6 | |
| 15 | HBM tester parasitic effects on high pin count devices with multiple power and ground pins | 2006 | 6 |
| 16 | 1995 | 5 | |
| 17 | 2000 | 5 | |
| 18 | 2004 | 4 | |
| 19 | 2005 | 4 | |
| 20 | 2002 | 3 |
About Jon Barth
Jon Barth is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Statistics, Probability and Uncertainty, Industrial and Manufacturing Engineering and Safety, Risk, Reliability and Quality, having authored 29 papers that have together received 371 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (23 papers), Integrated Circuits and Semiconductor Failure Analysis (1 paper), Particle Detector Development and Performance (1 paper), Electromagnetic Compatibility and Noise Suppression (1 paper), Reliability and Maintenance Optimization (1 paper), Pulsed Power Technology Applications (1 paper), Structural Integrity and Reliability Analysis (1 paper) and Magnetic Field Sensors Techniques (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (363 citations), Hardware and Architecture (3 citations), Safety, Risk, Reliability and Quality (3 citations), Aerospace Engineering (4 citations) and Statistics, Probability and Uncertainty (1 citation). Jon Barth has collaborated with scholars based in United States, Germany and Belgium. Frequent co-authors include Leo G. Henry, Koen G. Verhaege, Eugene R. Worley, Horst A. Gieser, J.T. Watt, David Johannes Pommerenke, George H. Weiss, Steven H. Voldman, Timothy J. Maloney and Nathaniel Peachey. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Electronics Packaging Manufacturing, Journal of Electrostatics, IEEE Instrumentation & Measurement Magazine and Electrical Overstress/Electrostatic Discharge Symposium.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.