Jon Barth
Impact in
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- Electrostatic Discharge in Electronics
- Electromagnetic Compatibility and Noise Suppression
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Silicon Carbide Semiconductor Technologies
- Radio Frequency Integrated Circuit Design
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- Physical Unclonable Functions (PUFs) and Hardware Security
Papers in
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- Electrostatic Discharge in Electronics 26
- Electromagnetic Compatibility and Noise Suppression 16
- Integrated Circuits and Semiconductor Failure Analysis 15
- Semiconductor materials and devices 5
- Silicon Carbide Semiconductor Technologies 4
- Microwave and Dielectric Measurement Techniques 2
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- High voltage insulation and dielectric phenomena 4
- Co-authors
- L. Henry (20 shared papers)K. Verhaege (7 shared papers)Matthew A. Kelly (7 shared papers)R.A. Ashton (7 shared papers)Horst Gieser (6 shared papers)E. Worley (2 shared papers)George H. Weiss (1 shared paper)Douglas C. Smith (1 shared paper)
- Journals
- Microelectronics Reliability (4 papers)IEEE Transactions on Electronics Packaging Manufacturing (1 paper)Journal of Electrostatics (1 paper)IEEE Instrumentation & Measurement Magazine (1 paper)Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) (2 papers)
- Partner nations
- United StatesGermanyBelgium
In The Last Decade
Jon Barth
27 papers receiving 331 citations
Peers
Comparison fields: 5 of 17
- Electrical and Electronic Engineering 369
- Hardware and Architecture 25
- Condensed Matter Physics 5
- Metals and Alloys 1
- Materials Chemistry 14
Countries citing papers authored by Jon Barth
This map shows the geographic impact of Jon Barth's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jon Barth with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jon Barth more than expected).
Fields of papers citing papers by Jon Barth
This network shows the impact of papers produced by Jon Barth. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jon Barth. The network helps show where Jon Barth may publish in the future.
Co-authors
The 25 scholars most cited alongside Jon Barth, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 30 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 147 | |
| 2 | 2002 | 34 | |
| 3 | 2003 | 22 | |
| 4 | Using VFTLP data to design for CDM robustness | 2009 | 20 |
| 5 | Standardization of the transmission line pulse (TLP) methodology for electrostatic discharge (ESD) | 2003 | 18 |
| 6 | 2002 | 15 | |
| 7 | 2002 | 13 | |
| 8 | 2002 | 12 | |
| 9 | Voltages before and after current in HBM testers and real HBM | 2005 | 11 |
| 10 | HMM round robin study: What to expect when testing components to the IEC 61000-4-2 waveform | 2012 | 8 |
| 11 | Correlation considerations II: Real HBM to HBM testers | 2002 | 8 |
| 12 | 1998 | 6 | |
| 13 | HBM tester parasitic effects on high pin count devices with multiple power and ground pins | 2006 | 6 |
| 14 | 2003 | 6 | |
| 15 | Real HBM & MM – the dV/dt threat | 2003 | 6 |
| 16 | Transmission-Line Pulse ESD Testing of ICs: A New | 2001 | 6 |
| 17 | 2000 | 5 | |
| 18 | 1995 | 4 | |
| 19 | 2004 | 4 | |
| 20 | 2005 | 4 |
About Jon Barth
Jon Barth is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Hardware and Architecture, Control and Systems Engineering and Computer Networks and Communications, having authored 30 papers that have together received 370 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (26 papers), Electromagnetic Compatibility and Noise Suppression (16 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers), Semiconductor materials and devices (5 papers), Silicon Carbide Semiconductor Technologies (4 papers), High voltage insulation and dielectric phenomena (4 papers), Microwave and Dielectric Measurement Techniques (2 papers) and Physical Unclonable Functions (PUFs) and Hardware Security (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (369 citations), Hardware and Architecture (25 citations), Condensed Matter Physics (5 citations), Metals and Alloys (1 citation) and Materials Chemistry (14 citations). Jon Barth has collaborated with scholars based in United States, Germany and Belgium. Frequent co-authors include L. Henry, K. Verhaege, Matthew A. Kelly, R.A. Ashton, Horst Gieser, E. Worley, George H. Weiss, Douglas C. Smith, David Pommerenke and M. B. Hopkins. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Electronics Packaging Manufacturing, Journal of Electrostatics, IEEE Instrumentation & Measurement Magazine and Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.