F. Hüe
Impact in
- Structural Biology top 0.5%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 9
- Semiconductor materials and devices 3
- Thin-Film Transistor Technologies 3
-
- Advanced Electron Microscopy Techniques and Applications 14
- Co-authors
- Martin Hÿtch (17 shared papers)Florent Houdellier (12 shared papers)E. Snoeck (7 shared papers)A. Claverie (11 shared papers)H. Bender (3 shared papers)J. M. Rodenburg (2 shared papers)Andrew Maiden (2 shared papers)Paul A. Midgley (2 shared papers)
- Journals
- Applied Physics Letters (2 papers)Ultramicroscopy (2 papers)Microscopy (2 papers)Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms (1 paper)Materials Science in Semiconductor Processing (1 paper)
- Partner nations
- FranceUnited KingdomBelgium
In The Last Decade
F. Hüe
26 papers receiving 999 citations
Peers
Comparison fields: 5 of 51
- Structural Biology 406
- Surfaces, Coatings and Films 206
- Radiation 235
- Atomic and Molecular Physics, and Optics 386
- Condensed Matter Physics 108
Countries citing papers authored by F. Hüe
This map shows the geographic impact of F. Hüe's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Hüe with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Hüe more than expected).
Fields of papers citing papers by F. Hüe
This network shows the impact of papers produced by F. Hüe. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Hüe. The network helps show where F. Hüe may publish in the future.
Co-authors
The 25 scholars most cited alongside F. Hüe, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 26 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2008 | 376 | |
| 2 | 2008 | 150 | |
| 3 | 2010 | 88 | |
| 4 | 2005 | 64 | |
| 5 | 2011 | 54 | |
| 6 | 2011 | 54 | |
| 7 | 2012 | 46 | |
| 8 | 2009 | 44 | |
| 9 | 2012 | 26 | |
| 10 | 2008 | 15 | |
| 11 | 2014 | 14 | |
| 12 | 2006 | 14 | |
| 13 | 2009 | 13 | |
| 14 | 2009 | 11 | |
| 15 | 2009 | 10 | |
| 16 | 2014 | 9 | |
| 17 | 2010 | 9 | |
| 18 | 2013 | 6 | |
| 19 | 2008 | 6 | |
| 20 | 2008 | 4 |
About F. Hüe
F. Hüe is a scholar working on Electrical and Electronic Engineering, Structural Biology, Surfaces, Coatings and Films, Materials Chemistry and Atomic and Molecular Physics, and Optics, having authored 26 papers that have together received 1.0k indexed citations. Recurring topics across this work include Advanced Electron Microscopy Techniques and Applications (14 papers), Electron and X-Ray Spectroscopy Techniques (9 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers), Advanced X-ray Imaging Techniques (5 papers), Force Microscopy Techniques and Applications (4 papers), Advanced Surface Polishing Techniques (3 papers), Semiconductor materials and devices (3 papers) and Thin-Film Transistor Technologies (3 papers). The work is most often cited by research in Structural Biology (406 citations), Surfaces, Coatings and Films (206 citations), Radiation (235 citations), Atomic and Molecular Physics, and Optics (386 citations) and Condensed Matter Physics (108 citations). F. Hüe has collaborated with scholars based in France, United Kingdom and Belgium. Frequent co-authors include Martin Hÿtch, Florent Houdellier, E. Snoeck, A. Claverie, H. Bender, J. M. Rodenburg, Andrew Maiden, Paul A. Midgley, F. Sweeney and Craig L. Johnson. Their work appears in journals such as Applied Physics Letters, Ultramicroscopy, Microscopy, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms and Materials Science in Semiconductor Processing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.