Eric Louis
Impact in
- Surfaces, Coatings and Films top 2%
- Optical Coatings and Gratings
- Electron and X-Ray Spectroscopy Techniques
- Radiation top 5%
- Advanced X-ray Imaging Techniques
- X-ray Spectroscopy and Fluorescence Analysis
Papers in
-
- Optical Coatings and Gratings 22
- Radiation 13
- Advanced X-ray Imaging Techniques 12
- X-ray Spectroscopy and Fluorescence Analysis 5
- Co-authors
- Fred Bijkerk (33 shared papers)Andrey Yakshin (12 shared papers)Robbert Wilhelmus Elisabeth van de Kruijs (10 shared papers)E. Zoethout (12 shared papers)Qiushi Huang (5 shared papers)Viacheslav V. Medvedev (2 shared papers)Stephan Müllender (6 shared papers)Igor A. Makhotkin (6 shared papers)
- Journals
- Optics Express (8 papers)Journal of the Optical Society of America B (2 papers)Journal of Synchrotron Radiation (2 papers)Applied Surface Science (2 papers)Journal of Applied Physics (1 paper)
- Partner nations
- NetherlandsGermanyPoland
In The Last Decade
Eric Louis
43 papers receiving 600 citations
Peers
Comparison fields: 5 of 34
- Surfaces, Coatings and Films 256
- Radiation 176
- Electrical and Electronic Engineering 284
- Instrumentation 9
- Computational Mechanics 77
Countries citing papers authored by Eric Louis
This map shows the geographic impact of Eric Louis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eric Louis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eric Louis more than expected).
Fields of papers citing papers by Eric Louis
This network shows the impact of papers produced by Eric Louis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eric Louis. The network helps show where Eric Louis may publish in the future.
Co-authors
The 25 scholars most cited alongside Eric Louis, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 45 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2017 | 78 | |
| 2 | 2013 | 46 | |
| 3 | 2000 | 43 | |
| 4 | 2000 | 31 | |
| 5 | 2009 | 30 | |
| 6 | 2012 | 29 | |
| 7 | 2002 | 28 | |
| 8 | 2011 | 27 | |
| 9 | 2018 | 27 | |
| 10 | 2017 | 22 | |
| 11 | 2010 | 21 | |
| 12 | 2003 | 20 | |
| 13 | 2001 | 19 | |
| 14 | 2017 | 19 | |
| 15 | 2016 | 17 | |
| 16 | 2000 | 16 | |
| 17 | 2016 | 15 | |
| 18 | 2009 | 14 | |
| 19 | 2012 | 14 | |
| 20 | 1999 | 13 |
About Eric Louis
Eric Louis is a scholar working on Surfaces, Coatings and Films, Radiation, Electrical and Electronic Engineering, Instrumentation and Computational Mechanics, having authored 45 papers that have together received 655 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (28 papers), Optical Coatings and Gratings (22 papers), Advanced X-ray Imaging Techniques (12 papers), X-ray Spectroscopy and Fluorescence Analysis (5 papers), Laser Material Processing Techniques (4 papers), Laser-Plasma Interactions and Diagnostics (3 papers), Astronomy and Astrophysical Research (3 papers) and Optical Polarization and Ellipsometry (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (256 citations), Radiation (176 citations), Electrical and Electronic Engineering (284 citations), Instrumentation (9 citations) and Computational Mechanics (77 citations). Eric Louis has collaborated with scholars based in Netherlands, Germany and Poland. Frequent co-authors include Fred Bijkerk, Andrey Yakshin, Robbert Wilhelmus Elisabeth van de Kruijs, E. Zoethout, Qiushi Huang, Viacheslav V. Medvedev, Stephan Müllender, Igor A. Makhotkin, Andrei M. Yakunin and Frank Scholze. Their work appears in journals such as Optics Express, Journal of the Optical Society of America B, Journal of Synchrotron Radiation, Applied Surface Science and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.