Eric Louis
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
- Optical Coatings and Gratings
- Radiation top 5%
- Advanced X-ray Imaging Techniques
- X-ray Spectroscopy and Fluorescence Analysis
Papers in
-
- Advancements in Photolithography Techniques 18
- Semiconductor materials and devices 5
-
- Electron and X-Ray Spectroscopy Techniques 13
- Optical Coatings and Gratings 11
- Co-authors
- F. Bijkerk (34 shared papers)Andrey Yakshin (13 shared papers)Robbert Wilhelmus Elisabeth van de Kruijs (11 shared papers)E. Zoethout (12 shared papers)Qiushi Huang (5 shared papers)S. Müllender (6 shared papers)Igor A. Makhotkin (6 shared papers)V. V. Medvedev (2 shared papers)
- Journals
- Optics Express (5 papers)Applied Surface Science (2 papers)Measurement Science and Technology (1 paper)Journal of the Optical Society of America B (1 paper)Journal of X-Ray Science and Technology (1 paper)
- Partner nations
- NetherlandsGermanyUnited States
In The Last Decade
Eric Louis
44 papers receiving 590 citations
Peers
Comparison fields: 5 of 65
- Surfaces, Coatings and Films 158
- Radiation 166
- Structural Biology 16
- Computational Mechanics 120
- Atomic and Molecular Physics, and Optics 172
Countries citing papers authored by Eric Louis
This map shows the geographic impact of Eric Louis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eric Louis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eric Louis more than expected).
Fields of papers citing papers by Eric Louis
This network shows the impact of papers produced by Eric Louis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eric Louis. The network helps show where Eric Louis may publish in the future.
Co-authors
The 25 scholars most cited alongside Eric Louis, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 46 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2017 | 75 | |
| 2 | 2014 | 51 | |
| 3 | 2013 | 46 | |
| 4 | 2000 | 42 | |
| 5 | 2009 | 29 | |
| 6 | 2012 | 29 | |
| 7 | 2011 | 27 | |
| 8 | 2002 | 26 | |
| 9 | 2000 | 26 | |
| 10 | 2017 | 22 | |
| 11 | 2003 | 20 | |
| 12 | 2010 | 20 | |
| 13 | 2001 | 18 | |
| 14 | 2000 | 16 | |
| 15 | 2009 | 14 | |
| 16 | 2016 | 14 | |
| 17 | 2012 | 13 | |
| 18 | 1999 | 13 | |
| 19 | 2008 | 12 | |
| 20 | 2014 | 12 |
About Eric Louis
Eric Louis is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Computational Mechanics, Radiation and Materials Chemistry, having authored 46 papers that have together received 626 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (18 papers), Electron and X-Ray Spectroscopy Techniques (13 papers), Optical Coatings and Gratings (11 papers), Diamond and Carbon-based Materials Research (10 papers), X-ray Spectroscopy and Fluorescence Analysis (10 papers), Ion-surface interactions and analysis (7 papers), Advanced X-ray Imaging Techniques (7 papers) and Semiconductor materials and devices (5 papers). The work is most often cited by research in Surfaces, Coatings and Films (158 citations), Radiation (166 citations), Structural Biology (16 citations), Computational Mechanics (120 citations) and Atomic and Molecular Physics, and Optics (172 citations). Eric Louis has collaborated with scholars based in Netherlands, Germany and United States. Frequent co-authors include F. Bijkerk, Andrey Yakshin, Robbert Wilhelmus Elisabeth van de Kruijs, E. Zoethout, Qiushi Huang, S. Müllender, Igor A. Makhotkin, V. V. Medvedev, Andrei M. Yakunin and Frank Scholze. Their work appears in journals such as Optics Express, Applied Surface Science, Measurement Science and Technology, Journal of the Optical Society of America B and Journal of X-Ray Science and Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.