Philippe Jonnard

2.2k citations
184 papers · 1.7k · h-index 21

Impact in

    • Optical Coatings and Gratings
    • Electron and X-Ray Spectroscopy Techniques
  • Radiation top 0.5%
    • X-ray Spectroscopy and Fluorescence Analysis
    • Advanced X-ray Imaging Techniques

Papers in

    • Electron and X-Ray Spectroscopy Techniques 80
    • Optical Coatings and Gratings 42
    • X-ray Spectroscopy and Fluorescence Analysis 90
    • Advanced X-ray Imaging Techniques 37

Philippe Jonnard

176 papers receiving 1.7k citations

Peers

Philippe Jonnard
Comparison fields: 5 of 52
  • Surfaces, Coatings and Films 757
  • Radiation 739
  • Instrumentation 29
  • Atomic and Molecular Physics, and Optics 298
  • Condensed Matter Physics 107
Replace Thomas A. Callcott with:
Thomas A. Callcott United States
K. L. Tsang Taiwan
H.‐J. Fitting Germany
E. Zoethout Netherlands
David D. Allred United States
Coryn F. Hague France
H.‐J. Hagemann Germany
Hans‐Ulrich Krebs Germany
Hans Grimmer Switzerland
B. Jouffrey France
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Citations per field
00.5×2×4×5.7×
Thomas A. Callcott · 1×
Citations per year

Countries citing papers authored by Philippe Jonnard

Since Specialization
Citations

This map shows the geographic impact of Philippe Jonnard's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Philippe Jonnard with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Philippe Jonnard more than expected).

Fields of papers citing papers by Philippe Jonnard

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Philippe Jonnard. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Philippe Jonnard. The network helps show where Philippe Jonnard may publish in the future.

Co-authors

The 25 scholars most cited alongside Philippe Jonnard, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Philippe Jonnard Line = papers co-authored together Philippe Jonnard links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 184 papers — load more, or switch the sort, to bring in the rest.

#Work
1 199465
2 200057
3 200249
4 201049
5 200447
6 200641
7 201235
8 201634
9 201932
10 200831
11 201030
12 201029
13 200528
14 201528
15 199326
16 199824
17 200423
18 200522
19 201722
20 200321

About Philippe Jonnard

Philippe Jonnard is a scholar working on Surfaces, Coatings and Films, Radiation, Atomic and Molecular Physics, and Optics, Condensed Matter Physics and Electrical and Electronic Engineering, having authored 184 papers that have together received 1.7k indexed citations. Recurring topics across this work include X-ray Spectroscopy and Fluorescence Analysis (90 papers), Electron and X-Ray Spectroscopy Techniques (80 papers), Optical Coatings and Gratings (42 papers), Advanced X-ray Imaging Techniques (37 papers), Semiconductor materials and interfaces (17 papers), Advancements in Photolithography Techniques (15 papers), X-ray Diffraction in Crystallography (11 papers) and Metal and Thin Film Mechanics (9 papers). The work is most often cited by research in Surfaces, Coatings and Films (757 citations), Radiation (739 citations), Instrumentation (29 citations), Atomic and Molecular Physics, and Optics (298 citations) and Condensed Matter Physics (107 citations). Philippe Jonnard has collaborated with scholars based in France, China and Italy. Frequent co-authors include Jean André, Karine Le Guen, Ch. Bonnelle, Françoise Vergand, Franck Delmotte, Zhanshan Wang, F. Bridou, Angelo Giglia, Ignace Jarrige and Jingtao Zhu. Their work appears in journals such as Surface and Interface Analysis, Applied Surface Science, Applied Physics Letters, Surface Science and Optics Express.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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