N.B. Koster
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
- Radiation top 10%
- X-ray Spectroscopy and Fluorescence Analysis
Papers in
-
- Advancements in Photolithography Techniques 20
- Integrated Circuits and Semiconductor Failure Analysis 6
- Semiconductor materials and devices 4
-
- Electron and X-Ray Spectroscopy Techniques 17
- Co-authors
- E. Louis (9 shared papers)Hamed Sadeghian (3 shared papers)F. Bijkerk (6 shared papers)R.W. Herfst (2 shared papers)Eberhard Spiller (2 shared papers)G. E. van Dorssen (2 shared papers)Rutger Schlatmann (1 shared paper)J. Verhoeven (1 shared paper)
- Journals
- Microelectronic Engineering (4 papers)Fusion Engineering and Design (3 papers)Journal of Applied Physics (2 papers)IEEE Transactions on Plasma Science (1 paper)Applied Surface Science (1 paper)
- Partner nations
- NetherlandsUnited StatesGermany
In The Last Decade
N.B. Koster
37 papers receiving 320 citations
Peers
Comparison fields: 5 of 38
- Surfaces, Coatings and Films 92
- Radiation 60
- Structural Biology 5
- Atomic and Molecular Physics, and Optics 103
- Electrical and Electronic Engineering 188
Countries citing papers authored by N.B. Koster
This map shows the geographic impact of N.B. Koster's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N.B. Koster with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N.B. Koster more than expected).
Fields of papers citing papers by N.B. Koster
This network shows the impact of papers produced by N.B. Koster. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N.B. Koster. The network helps show where N.B. Koster may publish in the future.
Co-authors
The 25 scholars most cited alongside N.B. Koster, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 38 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1998 | 40 | |
| 2 | 1994 | 38 | |
| 3 | 2002 | 26 | |
| 4 | 1997 | 21 | |
| 5 | 2013 | 20 | |
| 6 | 1995 | 19 | |
| 7 | 2014 | 18 | |
| 8 | 2018 | 14 | |
| 9 | 2019 | 13 | |
| 10 | 2014 | 13 | |
| 11 | 2018 | 13 | |
| 12 | 2003 | 11 | |
| 13 | 2016 | 10 | |
| 14 | 2001 | 10 | |
| 15 | 1995 | 10 | |
| 16 | 2016 | 8 | |
| 17 | 2014 | 5 | |
| 18 | 1996 | 4 | |
| 19 | 1997 | 4 | |
| 20 | 2012 | 4 |
About N.B. Koster
N.B. Koster is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Radiation, Atomic and Molecular Physics, and Optics and Biomedical Engineering, having authored 38 papers that have together received 331 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (20 papers), Electron and X-Ray Spectroscopy Techniques (17 papers), X-ray Spectroscopy and Fluorescence Analysis (10 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Ion-surface interactions and analysis (4 papers), Semiconductor materials and devices (4 papers), Semiconductor materials and interfaces (3 papers) and Force Microscopy Techniques and Applications (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (92 citations), Radiation (60 citations), Structural Biology (5 citations), Atomic and Molecular Physics, and Optics (103 citations) and Electrical and Electronic Engineering (188 citations). N.B. Koster has collaborated with scholars based in Netherlands, United States and Germany. Frequent co-authors include E. Louis, Hamed Sadeghian, F. Bijkerk, R.W. Herfst, Eberhard Spiller, G. E. van Dorssen, Rutger Schlatmann, J. Verhoeven, Л. А. Шмаенок and H. A. Padmore. Their work appears in journals such as Microelectronic Engineering, Fusion Engineering and Design, Journal of Applied Physics, IEEE Transactions on Plasma Science and Applied Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.