E. Zoethout

85 papers receiving 1.4k citations

Peers

E. Zoethout
Comparison fields: 5 of 71
  • Surfaces, Coatings and Films 196
  • Radiation 135
  • Materials Chemistry 574
  • Atomic and Molecular Physics, and Optics 358
  • Electrical and Electronic Engineering 638
Replace Yuden Teraoka with:
Yuden Teraoka Japan
J. Álvarez Spain
D. J. Tweet United States
P. Ascarelli Italy
David Babonneau France
L.S. Wieluński United States
E. Colavita Italy
V. S. Sundaram United States
David C. Ingram United States
C.A. Papageorgopoulos Greece
E. Zoethout relative to Yuden Teraoka Japan Yuden Teraoka's profile →
Citations per field
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Citations per year

Countries citing papers authored by E. Zoethout

Since Specialization
Citations

This map shows the geographic impact of E. Zoethout's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Zoethout with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Zoethout more than expected).

Fields of papers citing papers by E. Zoethout

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. Zoethout. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Zoethout. The network helps show where E. Zoethout may publish in the future.

Co-authors

The 25 scholars most cited alongside E. Zoethout, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with E. Zoethout Line = papers co-authored together E. Zoethout links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 87 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2015186
2 2015155
3 201995
4 200946
5 201346
6 202139
7 201036
8 200735
9 201831
10 200030
11 200930
12 201929
13 201229
14 201028
15 200027
16 200626
17 200626
18 201425
19 202123
20 200023

About E. Zoethout

E. Zoethout is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films and Mechanics of Materials, having authored 87 papers that have together received 1.5k indexed citations. Recurring topics across this work include Semiconductor materials and devices (19 papers), Semiconductor materials and interfaces (18 papers), Optical Coatings and Gratings (17 papers), Electron and X-Ray Spectroscopy Techniques (13 papers), Metal and Thin Film Mechanics (12 papers), Diamond and Carbon-based Materials Research (11 papers), Surface and Thin Film Phenomena (10 papers) and Ion-surface interactions and analysis (9 papers). The work is most often cited by research in Surfaces, Coatings and Films (196 citations), Radiation (135 citations), Materials Chemistry (574 citations), Atomic and Molecular Physics, and Optics (358 citations) and Electrical and Electronic Engineering (638 citations). E. Zoethout has collaborated with scholars based in Netherlands, Germany and Russia. Frequent co-authors include F. Bijkerk, Robbert Wilhelmus Elisabeth van de Kruijs, Andrey Yakshin, E. Louis, V. V. Medvedev, Chris Lee, Harold J. W. Zandvliet, Bene Poelsema, D. V. Lopaev and O. F. Yakushev. Their work appears in journals such as Journal of Applied Physics, Thin Solid Films, Surface Science, Optics Express and Applied Surface Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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