Patrick A. Kearney

965 citations
78 papers · 815 · h-index 14

Impact in

Papers in

Patrick A. Kearney

76 papers receiving 753 citations

Peers

Patrick A. Kearney
Comparison fields: 5 of 48
  • Surfaces, Coatings and Films 361
  • Radiation 189
  • Electrical and Electronic Engineering 541
  • Structural Biology 11
  • Computational Mechanics 138
Replace H. Meiling with:
H. Meiling Netherlands
Christian Laubis Germany
James A. Folta United States
Victor Soltwisch Germany
Roxann L. Engelstad United States
Yu. A. Vainer Russia
Eric Louis Netherlands
Renate Fechner Germany
J. E. Yater United States
М. V. Zorina Russia
Patrick A. Kearney relative to H. Meiling Netherlands H. Meiling's profile →
Citations per field
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Citations per year

Countries citing papers authored by Patrick A. Kearney

Since Specialization
Citations

This map shows the geographic impact of Patrick A. Kearney's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick A. Kearney with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick A. Kearney more than expected).

Fields of papers citing papers by Patrick A. Kearney

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Patrick A. Kearney. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick A. Kearney. The network helps show where Patrick A. Kearney may publish in the future.

Co-authors

The 25 scholars most cited alongside Patrick A. Kearney, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Patrick A. Kearney Line = papers co-authored together Patrick A. Kearney links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 78 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2001125
2 199670
3 199159
4 200333
5 199732
6 199130
7 200623
8 201522
9 199919
10 201418
11 199817
12 201415
13 201415
14 201614
15 199413
16 201113
17 199112
18 199411
19
8~12nm波長領域用のMo/Y多層膜鏡
199410
20 200510

About Patrick A. Kearney

Patrick A. Kearney is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Mechanics of Materials, Mechanical Engineering and Computational Mechanics, having authored 78 papers that have together received 815 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (53 papers), Electron and X-Ray Spectroscopy Techniques (48 papers), Integrated Circuits and Semiconductor Failure Analysis (22 papers), Metal and Thin Film Mechanics (10 papers), Welding Techniques and Residual Stresses (8 papers), Optical Coatings and Gratings (8 papers), Semiconductor materials and devices (7 papers) and Semiconductor materials and interfaces (7 papers). The work is most often cited by research in Surfaces, Coatings and Films (361 citations), Radiation (189 citations), Electrical and Electronic Engineering (541 citations), Structural Biology (11 citations) and Computational Mechanics (138 citations). Patrick A. Kearney has collaborated with scholars based in United States, Canada and Belgium. Frequent co-authors include D. G. Stearns, S. Bajt, Charles M. Falco, J. M. Slaughter, Claude Montcalm, Brian Sullivan, Mohamed Chaker, H. Pépin, Frank Goodwin and Obert R. Wood. Their work appears in journals such as Optics Letters, Journal of Applied Physics, Optical Engineering, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and Microelectronic Engineering.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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