S. Müllender
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
- Optical Coatings and Gratings
- Radiation top 5%
- X-ray Spectroscopy and Fluorescence Analysis
- Advanced X-ray Imaging Techniques
Papers in
-
- Advancements in Photolithography Techniques 7
- Semiconductor materials and devices 3
-
- Optical Coatings and Gratings 7
- Electron and X-Ray Spectroscopy Techniques 4
- Co-authors
- F. Bijkerk (12 shared papers)E. Zoethout (11 shared papers)Eric Louis (6 shared papers)Robbert Wilhelmus Elisabeth van de Kruijs (7 shared papers)Igor A. Makhotkin (4 shared papers)Andrei M. Yakunin (4 shared papers)E. Louis (7 shared papers)Andrey Yakshin (6 shared papers)
- Journals
- Optics Express (2 papers)Thin Solid Films (2 papers)Physical review. B, Condensed matter (1 paper)Microelectronic Engineering (1 paper)Applied Surface Science (1 paper)
- Partner nations
- GermanyNetherlandsFrance
In The Last Decade
S. Müllender
20 papers receiving 292 citations
Peers
Comparison fields: 5 of 33
- Surfaces, Coatings and Films 96
- Radiation 108
- Computational Mechanics 71
- Condensed Matter Physics 38
- Atomic and Molecular Physics, and Optics 75
Countries citing papers authored by S. Müllender
This map shows the geographic impact of S. Müllender's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Müllender with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Müllender more than expected).
Fields of papers citing papers by S. Müllender
This network shows the impact of papers produced by S. Müllender. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Müllender. The network helps show where S. Müllender may publish in the future.
Co-authors
The 25 scholars most cited alongside S. Müllender, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1996 | 55 | |
| 2 | 2013 | 46 | |
| 3 | 2007 | 34 | |
| 4 | 2012 | 29 | |
| 5 | 2006 | 26 | |
| 6 | 2001 | 24 | |
| 7 | 2009 | 13 | |
| 8 | 2012 | 13 | |
| 9 | 2010 | 11 | |
| 10 | 2008 | 11 | |
| 11 | 2003 | 10 | |
| 12 | 2006 | 8 | |
| 13 | 2005 | 6 | |
| 14 | 2010 | 6 | |
| 15 | 2005 | 5 | |
| 16 | 2006 | 5 | |
| 17 | 1997 | 1 | |
| 18 | 2007 | 1 | |
| 19 | 2012 | 1 | |
| 20 | 1995 | 1 |
About S. Müllender
S. Müllender is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering, Radiation and Materials Chemistry, having authored 20 papers that have together received 306 indexed citations. Recurring topics across this work include Optical Coatings and Gratings (7 papers), Advancements in Photolithography Techniques (7 papers), Diamond and Carbon-based Materials Research (4 papers), Electron and X-Ray Spectroscopy Techniques (4 papers), Advanced Surface Polishing Techniques (4 papers), Metal and Thin Film Mechanics (3 papers), X-ray Spectroscopy and Fluorescence Analysis (3 papers) and Semiconductor materials and devices (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (96 citations), Radiation (108 citations), Computational Mechanics (71 citations), Condensed Matter Physics (38 citations) and Atomic and Molecular Physics, and Optics (75 citations). S. Müllender has collaborated with scholars based in Germany, Netherlands and France. Frequent co-authors include F. Bijkerk, E. Zoethout, Eric Louis, Robbert Wilhelmus Elisabeth van de Kruijs, Igor A. Makhotkin, Andrei M. Yakunin, E. Louis, Andrey Yakshin, P. W. Loeffen and M. A. van Veenendaal. Their work appears in journals such as Optics Express, Thin Solid Films, Physical review. B, Condensed matter, Microelectronic Engineering and Applied Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.