Dmitry V. Boychenko
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
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- Radiation Effects in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Electrostatic Discharge in Electronics
- Radio Frequency Integrated Circuit Design
Papers in
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- Radiation Effects in Electronics 32
- Integrated Circuits and Semiconductor Failure Analysis 16
- Semiconductor materials and devices 9
- Electrostatic Discharge in Electronics 6
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- VLSI and Analog Circuit Testing 9
- Co-authors
- Alexander Y. Nikiforov (17 shared papers)Armen V. Sogoyan (11 shared papers)A.Y. Nikiforov (8 shared papers)A. I. Chumakov (7 shared papers)В.С. Першенков (2 shared papers)Gennady I. Zebrev (3 shared papers)А. Г. Кузнецов (4 shared papers)Maxim S. Gorbunov (1 shared paper)
- Journals
- IEEE Transactions on Nuclear Science (3 papers)Microelectronics Reliability (1 paper)Russian Microelectronics (5 papers)Facta universitatis - series Electronics and Energetics (2 papers)DOAJ (DOAJ: Directory of Open Access Journals) (3 papers)
- Partner nations
- RussiaCzechiaUnited States
In The Last Decade
Dmitry V. Boychenko
49 papers receiving 365 citations
Peers
Comparison fields: 5 of 33
- Hardware and Architecture 97
- Electrical and Electronic Engineering 325
- Computer Networks and Communications 66
- Control and Systems Engineering 52
- Safety, Risk, Reliability and Quality 19
Countries citing papers authored by Dmitry V. Boychenko
This map shows the geographic impact of Dmitry V. Boychenko's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Dmitry V. Boychenko with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Dmitry V. Boychenko more than expected).
Fields of papers citing papers by Dmitry V. Boychenko
This network shows the impact of papers produced by Dmitry V. Boychenko. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Dmitry V. Boychenko. The network helps show where Dmitry V. Boychenko may publish in the future.
Co-authors
The 16 scholars most cited alongside Dmitry V. Boychenko, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 57 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2014 | 26 | |
| 2 | 2015 | 26 | |
| 3 | 2006 | 25 | |
| 4 | 2014 | 24 | |
| 5 | 2015 | 21 | |
| 6 | 2015 | 15 | |
| 7 | 2014 | 15 | |
| 8 | 2012 | 15 | |
| 9 | 2014 | 13 | |
| 10 | 2016 | 13 | |
| 11 | 2015 | 12 | |
| 12 | 2015 | 12 | |
| 13 | 2005 | 12 | |
| 14 | 2015 | 9 | |
| 15 | 2011 | 9 | |
| 16 | 2015 | 8 | |
| 17 | 2015 | 8 | |
| 18 | 2017 | 7 | |
| 19 | 2014 | 7 | |
| 20 | 2007 | 7 |
About Dmitry V. Boychenko
Dmitry V. Boychenko is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Computer Networks and Communications, Control and Systems Engineering and Materials Chemistry, having authored 57 papers that have together received 377 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (32 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers), Semiconductor materials and devices (9 papers), VLSI and Analog Circuit Testing (9 papers), Sensor Technology and Measurement Systems (7 papers), Aerospace, Electronics, Mathematical Modeling (6 papers), Electrostatic Discharge in Electronics (6 papers) and Graphite, nuclear technology, radiation studies (5 papers). The work is most often cited by research in Hardware and Architecture (97 citations), Electrical and Electronic Engineering (325 citations), Computer Networks and Communications (66 citations), Control and Systems Engineering (52 citations) and Safety, Risk, Reliability and Quality (19 citations). Dmitry V. Boychenko has collaborated with scholars based in Russia, Czechia and United States. Frequent co-authors include Alexander Y. Nikiforov, Armen V. Sogoyan, A.Y. Nikiforov, A. I. Chumakov, В.С. Першенков, Gennady I. Zebrev, А. Г. Кузнецов, Maxim S. Gorbunov, Alexander Pechenkin and Andrey V. Yanenko. Their work appears in journals such as IEEE Transactions on Nuclear Science, Microelectronics Reliability, Russian Microelectronics, Facta universitatis - series Electronics and Energetics and DOAJ (DOAJ: Directory of Open Access Journals).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.