A.P. Dorey

460 citations
43 papers · 325 · h-index 13

Impact in

    • VLSI and Analog Circuit Testing
    • Integrated Circuits and Semiconductor Failure Analysis
    • Advanced MEMS and NEMS Technologies
    • Semiconductor materials and devices
    • Electrostatic Discharge in Electronics
    • Advancements in Semiconductor Devices and Circuit Design

Papers in

A.P. Dorey

38 papers receiving 286 citations

Peers

A.P. Dorey
Comparison fields: 5 of 53
  • Hardware and Architecture 145
  • Electrical and Electronic Engineering 255
  • Bioengineering 10
  • Control and Systems Engineering 41
  • Atomic and Molecular Physics, and Optics 53
Replace A. Kornfeld with:
A. Kornfeld Israel
M.G. Rosenfield United States
Jae-Kyung Wee South Korea
D.F. Guillou United States
Daniel Micusik Germany
Joo-Sun Choi South Korea
T. Reimann Germany
A. Vassighi Canada
Lei Luo United States
Shawn A. Hall United States
A.P. Dorey relative to A. Kornfeld Israel A. Kornfeld's profile →
Citations per field
00.5×2.9×
A. Kornfeld · 1×
Citations per year

Countries citing papers authored by A.P. Dorey

Since Specialization
Citations

This map shows the geographic impact of A.P. Dorey's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A.P. Dorey with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A.P. Dorey more than expected).

Fields of papers citing papers by A.P. Dorey

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A.P. Dorey. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A.P. Dorey. The network helps show where A.P. Dorey may publish in the future.

Co-authors

The 12 scholars most cited alongside A.P. Dorey, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with A.P. Dorey Line = papers co-authored together A.P. Dorey links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 43 papers — load more, or switch the sort, to bring in the rest.

#Work
1 196928
2 198327
3 199024
4 196922
5 199522
6 199618
7 199317
8 200215
9 200013
10 198613
11
Advances in actuators
199512
12 198312
13
Aspects of current reference generation and distribution for IDDx pass/fail current threshold determination
199312
14 19929
15 19939
16 20008
17 20026
18 19946
19 19956
20 19945

About A.P. Dorey

A.P. Dorey is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Media Technology, Biomedical Engineering and Computer Networks and Communications, having authored 43 papers that have together received 325 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (14 papers), VLSI and Analog Circuit Testing (12 papers), Experimental Learning in Engineering (9 papers), Sensor Technology and Measurement Systems (7 papers), Advanced MEMS and NEMS Technologies (6 papers), Mechatronics Education and Applications (5 papers), Semiconductor materials and devices (5 papers) and Analog and Mixed-Signal Circuit Design (5 papers). The work is most often cited by research in Hardware and Architecture (145 citations), Electrical and Electronic Engineering (255 citations), Bioengineering (10 citations), Control and Systems Engineering (41 citations) and Atomic and Molecular Physics, and Optics (53 citations). A.P. Dorey has collaborated with scholars based in United Kingdom, Netherlands and Ghana. Frequent co-authors include A. Richardson, J.E. Brignell, John H. Moore, B.K. Jones, K. Baker, D. A. Bradley, Ian Grout, D.A. Bradley, P.C. Russell and Robert B. Reichenbach. Their work appears in journals such as Electronics Letters, Measurement Science and Technology, Ultrasonics, Quality and Reliability Engineering International and Thin Solid Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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