Russian Microelectronics

4.0k citations
1.2k papers · · active since 1950

Impact in

Papers in

    • Semiconductor materials and devices 211
    • Advancements in Semiconductor Devices and Circuit Design 133
    • Integrated Circuits and Semiconductor Failure Analysis 114
    • Plasma Diagnostics and Applications 94
    • Radiation Effects in Electronics 81
    • Semiconductor materials and interfaces 89
    • Semiconductor Quantum Structures and Devices 86

Russian Microelectronics

943 papers receiving 3.7k citations

Peers

Russian Microelectronics
Comparison fields: 5 of 123
  • Structural Biology 70
  • Hardware and Architecture 319
  • Electrical and Electronic Engineering 2.7k
  • Nuclear Energy and Engineering 21
  • Surfaces, Coatings and Films 224
Replace Nuclear Science and Techniques with:
Nuclear Science and Techniques China
Journal of Micro/Nanolithography MEMS and MOEMS United States
IEEE Transactions on NanoBioscience China
Journal of Research of the National Institute of Standards and Technology United States
SoftwareX United States
Metrology and Measurement Systems Poland
Machine Learning Science and Technology United States
International Journal of High Speed Electronics and Systems United States
Sensor Review China
Journal of Nanoelectronics and Optoelectronics China
Russian Microelectronics relative to Nuclear Science and Techniques China Nuclear Science and Techniques's profile →
Citations per field
00.5×7.1×
Nuclear Science and Techniques · 1×
Citations per year

Countries where authors publish in Russian Microelectronics

Since Specialization
Citations

This map shows the geographic impact of research published in Russian Microelectronics. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers published in Russian Microelectronics with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Russian Microelectronics more than expected).

Fields of papers published in Russian Microelectronics

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers published in Russian Microelectronics. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers published in Russian Microelectronics.

About Russian Microelectronics

The 1.2k papers published in Russian Microelectronics in the last decades have received a total of 4.0k indexed citations . Papers published in Russian Microelectronics usually cover Electrical and Electronic Engineering (803 papers), Atomic and Molecular Physics, and Optics (352 papers), Hardware and Architecture (67 papers), Nuclear Energy and Engineering (4 papers) and Surfaces, Coatings and Films (47 papers) specifically the topics of Semiconductor materials and devices (211 papers), Advancements in Semiconductor Devices and Circuit Design (133 papers), Integrated Circuits and Semiconductor Failure Analysis (114 papers), Plasma Diagnostics and Applications (94 papers), Semiconductor materials and interfaces (89 papers), Semiconductor Quantum Structures and Devices (86 papers), Radiation Effects in Electronics (81 papers) and Metal and Thin Film Mechanics (65 papers). The most active scholars publishing in Russian Microelectronics are A. V. Tsukanov, A. I. Chumakov, Yu. A. Novikov, A.Y. Nikiforov, K. V. Rudenko, Alexander Efremov, А. В. Фадеев, Г. В. Кузнецов, Mikhail А. Sheremet and A. S. Korotkov.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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