F. Bezerra
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
- Radiation top 5%
- Radiation Detection and Scintillator Technologies
Papers in
-
- Radiation Effects in Electronics 68
- Integrated Circuits and Semiconductor Failure Analysis 28
- Semiconductor materials and devices 27
- Electrostatic Discharge in Electronics 13
- Radiation 15
- Radiation Detection and Scintillator Technologies 13
- Co-authors
- S. Duzellier (11 shared papers)G. Hubert (9 shared papers)Robert Ecoffet (13 shared papers)R. Ecoffet (25 shared papers)E. Lorfèvre (19 shared papers)C. Inguimbert (7 shared papers)L. Artola (10 shared papers)R. Marec (11 shared papers)
- Journals
- IEEE Transactions on Nuclear Science (41 papers)Journal of Instrumentation (1 paper)Aerospace (1 paper)International Journal of Microwave and Wireless Technologies (1 paper)Proceedings - International Symposium for Testing and Failure Analysis (1 paper)
- Partner nations
- FranceUnited StatesSwitzerland
In The Last Decade
F. Bezerra
83 papers receiving 901 citations
Peers
Comparison fields: 5 of 42
- Hardware and Architecture 168
- Radiation 127
- Electrical and Electronic Engineering 839
- Safety, Risk, Reliability and Quality 45
- Nuclear and High Energy Physics 64
Countries citing papers authored by F. Bezerra
This map shows the geographic impact of F. Bezerra's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Bezerra with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Bezerra more than expected).
Fields of papers citing papers by F. Bezerra
This network shows the impact of papers produced by F. Bezerra. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Bezerra. The network helps show where F. Bezerra may publish in the future.
Co-authors
The 25 scholars most cited alongside F. Bezerra, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 87 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2009 | 110 | |
| 2 | 2011 | 58 | |
| 3 | 2011 | 31 | |
| 4 | 2010 | 31 | |
| 5 | 2009 | 30 | |
| 6 | 2011 | 27 | |
| 7 | 2010 | 27 | |
| 8 | 2014 | 26 | |
| 9 | 2013 | 26 | |
| 10 | 2011 | 22 | |
| 11 | 2008 | 20 | |
| 12 | 2010 | 20 | |
| 13 | 2007 | 19 | |
| 14 | 2009 | 18 | |
| 15 | 2011 | 18 | |
| 16 | 2019 | 18 | |
| 17 | 2008 | 17 | |
| 18 | 2011 | 16 | |
| 19 | 2011 | 16 | |
| 20 | 2010 | 16 |
About F. Bezerra
F. Bezerra is a scholar working on Electrical and Electronic Engineering, Radiation, Hardware and Architecture, Nuclear and High Energy Physics and Computational Mechanics, having authored 87 papers that have together received 922 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (68 papers), Integrated Circuits and Semiconductor Failure Analysis (28 papers), Semiconductor materials and devices (27 papers), Electrostatic Discharge in Electronics (13 papers), Radiation Detection and Scintillator Technologies (13 papers), Radiation Therapy and Dosimetry (11 papers), Particle Detector Development and Performance (11 papers) and Ion-surface interactions and analysis (10 papers). The work is most often cited by research in Hardware and Architecture (168 citations), Radiation (127 citations), Electrical and Electronic Engineering (839 citations), Safety, Risk, Reliability and Quality (45 citations) and Nuclear and High Energy Physics (64 citations). F. Bezerra has collaborated with scholars based in France, United States and Switzerland. Frequent co-authors include S. Duzellier, G. Hubert, Robert Ecoffet, R. Ecoffet, E. Lorfèvre, C. Inguimbert, L. Artola, R. Marec, L. Dusseau and P. Calvel. Their work appears in journals such as IEEE Transactions on Nuclear Science, Journal of Instrumentation, Aerospace, International Journal of Microwave and Wireless Technologies and Proceedings - International Symposium for Testing and Failure Analysis.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.