H. Lapuyade
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
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- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Radio Frequency Integrated Circuit Design
- Advancements in PLL and VCO Technologies
Papers in
-
- Radio Frequency Integrated Circuit Design 13
- Advancements in PLL and VCO Technologies 13
- Radiation Effects in Electronics 12
- Integrated Circuits and Semiconductor Failure Analysis 12
- Semiconductor materials and devices 8
- Electrostatic Discharge in Electronics 6
-
- VLSI and Analog Circuit Testing 6
- Co-authors
- D. Lewis (8 shared papers)Yann Deval (23 shared papers)A. Touboul (4 shared papers)V. Pouget (7 shared papers)P. Fouillat (7 shared papers)F. Beaudoin (2 shared papers)Jean-Baptiste Bégueret (1 shared paper)Ian O’Connor (1 shared paper)
- Journals
- IEEE Transactions on Nuclear Science (9 papers)Microelectronics Reliability (4 papers)IEEE Transactions on Circuits & Systems II Express Briefs (3 papers)IEEE Access (1 paper)Microelectronic Engineering (1 paper)
- Partner nations
- FranceUnited StatesBrazil
In The Last Decade
H. Lapuyade
33 papers receiving 341 citations
Peers
Comparison fields: 5 of 30
- Hardware and Architecture 87
- Electrical and Electronic Engineering 337
- Computational Mechanics 52
- Instrumentation 7
- Radiation 10
Countries citing papers authored by H. Lapuyade
This map shows the geographic impact of H. Lapuyade's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. Lapuyade with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. Lapuyade more than expected).
Fields of papers citing papers by H. Lapuyade
This network shows the impact of papers produced by H. Lapuyade. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. Lapuyade. The network helps show where H. Lapuyade may publish in the future.
Co-authors
The 25 scholars most cited alongside H. Lapuyade, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 36 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 63 | |
| 2 | 2009 | 52 | |
| 3 | 2001 | 46 | |
| 4 | 2002 | 38 | |
| 5 | 1999 | 27 | |
| 6 | 2000 | 22 | |
| 7 | 1996 | 13 | |
| 8 | 2007 | 13 | |
| 9 | 2002 | 13 | |
| 10 | 2007 | 8 | |
| 11 | 2007 | 7 | |
| 12 | 2006 | 7 | |
| 13 | 2014 | 6 | |
| 14 | 2023 | 6 | |
| 15 | 2019 | 5 | |
| 16 | 1-V low-noise 200 MHz relaxation oscillator | 1997 | 4 |
| 17 | 2002 | 4 | |
| 18 | 2001 | 4 | |
| 19 | 2002 | 4 | |
| 20 | 2024 | 3 |
About H. Lapuyade
H. Lapuyade is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Biomedical Engineering, Computational Mechanics and Computer Networks and Communications, having authored 36 papers that have together received 360 indexed citations. Recurring topics across this work include Radio Frequency Integrated Circuit Design (13 papers), Advancements in PLL and VCO Technologies (13 papers), Radiation Effects in Electronics (12 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers), Semiconductor materials and devices (8 papers), Electrostatic Discharge in Electronics (6 papers), VLSI and Analog Circuit Testing (6 papers) and Analog and Mixed-Signal Circuit Design (5 papers). The work is most often cited by research in Hardware and Architecture (87 citations), Electrical and Electronic Engineering (337 citations), Computational Mechanics (52 citations), Instrumentation (7 citations) and Radiation (10 citations). H. Lapuyade has collaborated with scholars based in France, United States and Brazil. Frequent co-authors include D. Lewis, Yann Deval, A. Touboul, V. Pouget, P. Fouillat, F. Beaudoin, Jean-Baptiste Bégueret, Ian O’Connor, David Navarro and M.-C. Calvet. Their work appears in journals such as IEEE Transactions on Nuclear Science, Microelectronics Reliability, IEEE Transactions on Circuits & Systems II Express Briefs, IEEE Access and Microelectronic Engineering.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.