Cher Ming Tan
Impact in
- Automotive Engineering top 1%
- Advanced Battery Technologies Research
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- Electronic Packaging and Soldering Technologies
- Semiconductor materials and devices
- Advancements in Battery Materials
- 3D IC and TSV technologies
- Advanced Battery Materials and Technologies
Papers in
-
- Electronic Packaging and Soldering Technologies 80
- Semiconductor materials and devices 58
- 3D IC and TSV technologies 34
- Integrated Circuits and Semiconductor Failure Analysis 30
- Silicon Carbide Semiconductor Technologies 18
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- Copper Interconnects and Reliability 61
- Co-authors
- Feng Leng (5 shared papers)Arijit Roy (11 shared papers)Michael Pecht (2 shared papers)Preetpal Singh (20 shared papers)Jun Wei (20 shared papers)Nagarajan Raghavan (14 shared papers)Beng Kang Tay (4 shared papers)Mui Ling Sharon Nai (20 shared papers)
In The Last Decade
Cher Ming Tan
237 papers receiving 4.0k citations
Cher Ming Tan's Hit Papers
Peers
Comparison fields: 5 of 128
- Automotive Engineering 780
- Electrical and Electronic Engineering 2.7k
- Electronic, Optical and Magnetic Materials 803
- Safety, Risk, Reliability and Quality 233
- Condensed Matter Physics 278
Countries citing papers authored by Cher Ming Tan
This map shows the geographic impact of Cher Ming Tan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Cher Ming Tan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Cher Ming Tan more than expected).
Fields of papers citing papers by Cher Ming Tan
This network shows the impact of papers produced by Cher Ming Tan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Cher Ming Tan. The network helps show where Cher Ming Tan may publish in the future.
Co-authors
The 25 scholars most cited alongside Cher Ming Tan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 263 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | Effect of Temperature on the Aging rate of Li Ion Battery Operating above Room Temperature Hit paper breakdown → | 2015 | 462 |
| 2 | 2007 | 186 | |
| 3 | 2003 | 159 | |
| 4 | 2010 | 141 | |
| 5 | 2009 | 105 | |
| 6 | 2010 | 98 | |
| 7 | 2010 | 95 | |
| 8 | 2007 | 80 | |
| 9 | 2012 | 75 | |
| 10 | 2014 | 74 | |
| 11 | 2007 | 74 | |
| 12 | 2010 | 72 | |
| 13 | 2012 | 68 | |
| 14 | 2007 | 65 | |
| 15 | 2019 | 60 | |
| 16 | 2016 | 59 | |
| 17 | 2010 | 59 | |
| 18 | 2020 | 56 | |
| 19 | 2005 | 56 | |
| 20 | 2014 | 53 |
About Cher Ming Tan
Cher Ming Tan is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry, Biomedical Engineering and Condensed Matter Physics, having authored 263 papers that have together received 4.1k indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (80 papers), Copper Interconnects and Reliability (61 papers), Semiconductor materials and devices (58 papers), 3D IC and TSV technologies (34 papers), Integrated Circuits and Semiconductor Failure Analysis (30 papers), GaN-based semiconductor devices and materials (25 papers), Silicon Carbide Semiconductor Technologies (18 papers) and Advanced Battery Technologies Research (17 papers). The work is most often cited by research in Automotive Engineering (780 citations), Electrical and Electronic Engineering (2.7k citations), Electronic, Optical and Magnetic Materials (803 citations), Safety, Risk, Reliability and Quality (233 citations) and Condensed Matter Physics (278 citations). Cher Ming Tan has collaborated with scholars based in Singapore, Taiwan and China. Frequent co-authors include Feng Leng, Arijit Roy, Michael Pecht, Preetpal Singh, Jun Wei, Nagarajan Raghavan, Beng Kang Tay, Mui Ling Sharon Nai, Minh Duc Le and Charles Baudot. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability, Applied Sciences, Journal of Applied Physics and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.