B Bunday
Impact in
- Surfaces, Coatings and Films top 5%
- Optical Coatings and Gratings
- Electron and X-Ray Spectroscopy Techniques
- Structural Biology top 10%
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 5
- Advancements in Photolithography Techniques 4
- Semiconductor materials and devices 2
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- Surface Roughness and Optical Measurements 3
- Co-authors
- Brian M. Barnes (3 shared papers)Ndubuisi G. Orji (2 shared papers)C. Beitia (2 shared papers)Mark Neisser (2 shared papers)Yaw S. Obeng (2 shared papers)András Vládar (2 shared papers)Mustafa Badaroglu (2 shared papers)R. Joseph Kline (2 shared papers)
- Journals
- Nature Electronics (2 papers)Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (4 papers)
- Partner nations
- United StatesBelgiumFrance
In The Last Decade
B Bunday
9 papers receiving 372 citations
B Bunday's Hit Papers
Peers
Comparison fields: 5 of 50
- Surfaces, Coatings and Films 115
- Structural Biology 16
- Electrical and Electronic Engineering 247
- Biomedical Engineering 141
- Computational Mechanics 61
Countries citing papers authored by B Bunday
This map shows the geographic impact of B Bunday's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B Bunday with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B Bunday more than expected).
Fields of papers citing papers by B Bunday
This network shows the impact of papers produced by B Bunday. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B Bunday. The network helps show where B Bunday may publish in the future.
Co-authors
The 25 scholars most cited alongside B Bunday, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | Metrology for the next generation of semiconductor devices Hit paper breakdown → | 2018 | 343 |
| 2 | 2009 | 21 | |
| 3 | 2005 | 9 | |
| 4 | 2006 | 9 | |
| 5 | 2015 | 8 | |
| 6 | 2018 | 5 | |
| 7 | 2006 | 3 | |
| 8 | 2013 | 2 | |
| 9 | 2006 | 1 |
About B Bunday
B Bunday is a scholar working on Electrical and Electronic Engineering, Computational Mechanics, Surfaces, Coatings and Films, Mechanical Engineering and Biomedical Engineering, having authored 9 papers that have together received 401 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (5 papers), Advancements in Photolithography Techniques (4 papers), Surface Roughness and Optical Measurements (3 papers), Advanced Measurement and Metrology Techniques (2 papers), Electron and X-Ray Spectroscopy Techniques (2 papers), Semiconductor materials and devices (2 papers), Advanced Surface Polishing Techniques (2 papers) and Electronic and Structural Properties of Oxides (1 paper). The work is most often cited by research in Surfaces, Coatings and Films (115 citations), Structural Biology (16 citations), Electrical and Electronic Engineering (247 citations), Biomedical Engineering (141 citations) and Computational Mechanics (61 citations). B Bunday has collaborated with scholars based in United States, Belgium and France. Frequent co-authors include Brian M. Barnes, Ndubuisi G. Orji, C. Beitia, Mark Neisser, Yaw S. Obeng, András Vládar, Mustafa Badaroglu, R. Joseph Kline, Umberto Celano and N. Alan Heckert. Their work appears in journals such as Nature Electronics, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.