Wangyong Chen
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Ferroelectric and Negative Capacitance Devices
- Silicon Carbide Semiconductor Technologies
- Advanced Memory and Neural Computing
- Integrated Circuits and Semiconductor Failure Analysis
Papers in
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- Semiconductor materials and devices 42
- Advancements in Semiconductor Devices and Circuit Design 30
- Integrated Circuits and Semiconductor Failure Analysis 11
- Ferroelectric and Negative Capacitance Devices 9
- Radiation Effects in Electronics 7
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- Copper Interconnects and Reliability 10
- Co-authors
- Linlin Cai (44 shared papers)Gang Du (20 shared papers)Xiaoyan Liu (19 shared papers)Xing Zhang (5 shared papers)Jinfeng Kang (5 shared papers)Xing Zhang (6 shared papers)Yudi Zhao (5 shared papers)Peng Huang (4 shared papers)
- Journals
- IEEE Transactions on Electron Devices (10 papers)Microelectronics Reliability (7 papers)IEEE Electron Device Letters (3 papers)Science China Information Sciences (2 papers)IEEE Transactions on Device and Materials Reliability (2 papers)
- Partner nations
- China
In The Last Decade
Wangyong Chen
40 papers receiving 301 citations
Peers
Comparison fields: 5 of 25
- Electrical and Electronic Engineering 288
- Hardware and Architecture 8
- Materials Chemistry 44
- Electronic, Optical and Magnetic Materials 17
- Biomedical Engineering 33
Countries citing papers authored by Wangyong Chen
This map shows the geographic impact of Wangyong Chen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Wangyong Chen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Wangyong Chen more than expected).
Fields of papers citing papers by Wangyong Chen
This network shows the impact of papers produced by Wangyong Chen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Wangyong Chen. The network helps show where Wangyong Chen may publish in the future.
Co-authors
The 25 scholars most cited alongside Wangyong Chen, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 55 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2018 | 81 | |
| 2 | 2018 | 21 | |
| 3 | 2018 | 18 | |
| 4 | 2019 | 17 | |
| 5 | 2018 | 17 | |
| 6 | 2021 | 15 | |
| 7 | 2019 | 14 | |
| 8 | 2023 | 9 | |
| 9 | 2018 | 8 | |
| 10 | 2019 | 7 | |
| 11 | 2023 | 7 | |
| 12 | 2022 | 7 | |
| 13 | 2019 | 6 | |
| 14 | 2019 | 6 | |
| 15 | 2023 | 5 | |
| 16 | 2023 | 5 | |
| 17 | 2020 | 4 | |
| 18 | 2022 | 4 | |
| 19 | 2020 | 4 | |
| 20 | 2019 | 4 |
About Wangyong Chen
Wangyong Chen is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry, Hardware and Architecture and Atomic and Molecular Physics, and Optics, having authored 55 papers that have together received 306 indexed citations. Recurring topics across this work include Semiconductor materials and devices (42 papers), Advancements in Semiconductor Devices and Circuit Design (30 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Copper Interconnects and Reliability (10 papers), Ferroelectric and Negative Capacitance Devices (9 papers), Radiation Effects in Electronics (7 papers), Thermal properties of materials (7 papers) and VLSI and Analog Circuit Testing (5 papers). The work is most often cited by research in Electrical and Electronic Engineering (288 citations), Hardware and Architecture (8 citations), Materials Chemistry (44 citations), Electronic, Optical and Magnetic Materials (17 citations) and Biomedical Engineering (33 citations). Wangyong Chen has collaborated with scholars based in China. Frequent co-authors include Linlin Cai, Gang Du, Xiaoyan Liu, Xing Zhang, Jinfeng Kang, Xing Zhang, Yudi Zhao, Peng Huang, Xiaoyan Liu and Yandong He. Their work appears in journals such as IEEE Transactions on Electron Devices, Microelectronics Reliability, IEEE Electron Device Letters, Science China Information Sciences and IEEE Transactions on Device and Materials Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.