C. Domke

568 citations
15 papers · 479 · h-index 12

Impact in

Papers in

C. Domke

15 papers receiving 472 citations

Peers

C. Domke
Comparison fields: 5 of 25
  • Structural Biology 40
  • Atomic and Molecular Physics, and Optics 366
  • Electrical and Electronic Engineering 291
  • Surfaces, Coatings and Films 28
  • Condensed Matter Physics 40
Replace Uwe Scheithauer with:
Uwe Scheithauer Germany
K. Werner Netherlands
A. Savage United States
M. Ospelt Switzerland
D. Bahnck United States
S. M. Mokler United Kingdom
Andreas Biermanns Germany
H. Lafontaine Canada
Z. Liliental United States
Shaoping Tang United States
C. Domke relative to Uwe Scheithauer Germany Uwe Scheithauer's profile →
Citations per field
00.5×
Uwe Scheithauer · 1×
Citations per year

Countries citing papers authored by C. Domke

Since Specialization
Citations

This map shows the geographic impact of C. Domke's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Domke with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Domke more than expected).

Fields of papers citing papers by C. Domke

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. Domke. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Domke. The network helps show where C. Domke may publish in the future.

Co-authors

The 15 scholars most cited alongside C. Domke, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with C. Domke Line = papers co-authored together C. Domke links everyone, so they are left out of the graph.

All Works

15 of 15 papers shown
#Work
1 1996105
2 199665
3 199760
4 199656
5 199832
6 199729
7 199626
8 200124
9 199823
10 199819
11 200116
12 199912
13 19999
14 19992
15 19971

About C. Domke

C. Domke is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Materials Chemistry, Structural Biology and Mechanics of Materials, having authored 15 papers that have together received 479 indexed citations. Recurring topics across this work include Surface and Thin Film Phenomena (8 papers), Semiconductor materials and devices (6 papers), Advanced Electron Microscopy Techniques and Applications (5 papers), Semiconductor materials and interfaces (3 papers), Quantum Dots Synthesis And Properties (3 papers), Semiconductor Quantum Structures and Devices (3 papers), Chalcogenide Semiconductor Thin Films (2 papers) and Electronic and Structural Properties of Oxides (2 papers). The work is most often cited by research in Structural Biology (40 citations), Atomic and Molecular Physics, and Optics (366 citations), Electrical and Electronic Engineering (291 citations), Surfaces, Coatings and Films (28 citations) and Condensed Matter Physics (40 citations). C. Domke has collaborated with scholars based in Germany and United States. Frequent co-authors include Ph. Ebert, K. Urban, M. Heinrich, J. Gebauer, R. Krause‐Rehberg, Bernd Engels, Stefan Blügel, P. Richard, K. Schroeder and Matthias Simon. Their work appears in journals such as Physical review. B, Condensed matter, Physical Review Letters, Surface Science, Applied Physics Letters and Thin Solid Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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