U. Haak
Impact in
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- Optical Coatings and Gratings
Papers in
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- Advancements in Semiconductor Devices and Circuit Design 3
- Radio Frequency Integrated Circuit Design 3
- Advancements in Photolithography Techniques 3
- Thin-Film Transistor Technologies 2
- Photonic and Optical Devices 2
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- Near-Field Optical Microscopy 3
- Co-authors
- J. Drews (6 shared papers)D. Wolansky (5 shared papers)Katrin Schulz (7 shared papers)M. Birkholz (4 shared papers)K.‐E. Ehwald (5 shared papers)Joerg Bischoff (3 shared papers)S. Marschmeyer (5 shared papers)D. Schmidt (3 shared papers)
- Journals
- Journal of Applied Physics (1 paper)Microelectronic Engineering (1 paper)Advanced Functional Materials (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (8 papers)
- Partner nations
- GermanyUnited States
In The Last Decade
U. Haak
15 papers receiving 164 citations
Peers
Comparison fields: 5 of 28
- Nuclear Energy and Engineering 3
- Surfaces, Coatings and Films 29
- Electrical and Electronic Engineering 126
- Bioengineering 10
- Biomedical Engineering 53
Countries citing papers authored by U. Haak
This map shows the geographic impact of U. Haak's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by U. Haak with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites U. Haak more than expected).
Fields of papers citing papers by U. Haak
This network shows the impact of papers produced by U. Haak. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by U. Haak. The network helps show where U. Haak may publish in the future.
Co-authors
The 25 scholars most cited alongside U. Haak, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2011 | 39 | |
| 2 | 2004 | 34 | |
| 3 | 2008 | 28 | |
| 4 | 2001 | 15 | |
| 5 | 2013 | 14 | |
| 6 | 1998 | 10 | |
| 7 | 2011 | 7 | |
| 8 | 2005 | 5 | |
| 9 | 2006 | 4 | |
| 10 | 2002 | 3 | |
| 11 | 2008 | 3 | |
| 12 | 2012 | 3 | |
| 13 | 2008 | 3 | |
| 14 | 1999 | 3 | |
| 15 | 2008 | 1 |
About U. Haak
U. Haak is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films and Computational Mechanics, having authored 15 papers that have together received 172 indexed citations. Recurring topics across this work include Optical Coatings and Gratings (3 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers), Near-Field Optical Microscopy (3 papers), Radio Frequency Integrated Circuit Design (3 papers), Advancements in Photolithography Techniques (3 papers), Surface Roughness and Optical Measurements (2 papers), Thin-Film Transistor Technologies (2 papers) and Photonic and Optical Devices (2 papers). The work is most often cited by research in Nuclear Energy and Engineering (3 citations), Surfaces, Coatings and Films (29 citations), Electrical and Electronic Engineering (126 citations), Bioengineering (10 citations) and Biomedical Engineering (53 citations). U. Haak has collaborated with scholars based in Germany and United States. Frequent co-authors include J. Drews, D. Wolansky, Katrin Schulz, M. Birkholz, K.‐E. Ehwald, Joerg Bischoff, S. Marschmeyer, D. Schmidt, Róbert Brunner and R. Barth. Their work appears in journals such as Journal of Applied Physics, Microelectronic Engineering, Advanced Functional Materials and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.