M.P. Baze
Impact in
- Hardware and Architecture top 1%
- VLSI and Analog Circuit Testing
-
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Low-power high-performance VLSI design
- Advancements in Semiconductor Devices and Circuit Design
- Electrostatic Discharge in Electronics
- Advanced Memory and Neural Computing
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 19
- Radiation Effects in Electronics 19
- Semiconductor materials and devices 18
- Electrostatic Discharge in Electronics 8
- Advancements in Semiconductor Devices and Circuit Design 6
- Low-power high-performance VLSI design 5
-
- VLSI and Analog Circuit Testing 8
- Physical Unclonable Functions (PUFs) and Hardware Security 2
- Co-authors
- S. Büchner (7 shared papers)Dale McMorrow (7 shared papers)A.H. Johnston (9 shared papers)L. W. Massengill (8 shared papers)Oluwole A. Amusan (8 shared papers)B. L. Bhuva (7 shared papers)Joseph S. Melinger (3 shared papers)David J. Brown (1 shared paper)
- Journals
- IEEE Transactions on Nuclear Science (22 papers)IEEE Transactions on Device and Materials Reliability (2 papers)IEEE Transactions on Very Large Scale Integration (VLSI) Systems (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (1 paper)
- Partner nations
- United StatesFranceCanada
In The Last Decade
M.P. Baze
30 papers receiving 1.2k citations
Peers
Comparison fields: 5 of 38
- Hardware and Architecture 666
- Electrical and Electronic Engineering 1.3k
- Radiation 45
- Safety, Risk, Reliability and Quality 31
- Nuclear and High Energy Physics 31
Countries citing papers authored by M.P. Baze
This map shows the geographic impact of M.P. Baze's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M.P. Baze with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M.P. Baze more than expected).
Fields of papers citing papers by M.P. Baze
This network shows the impact of papers produced by M.P. Baze. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M.P. Baze. The network helps show where M.P. Baze may publish in the future.
Co-authors
The 25 scholars most cited alongside M.P. Baze, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 31 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1997 | 190 | |
| 2 | 1997 | 128 | |
| 3 | 2000 | 101 | |
| 4 | 2005 | 95 | |
| 5 | 2008 | 93 | |
| 6 | 2007 | 82 | |
| 7 | 2007 | 70 | |
| 8 | 1991 | 65 | |
| 9 | 2009 | 61 | |
| 10 | 2006 | 53 | |
| 11 | 2007 | 48 | |
| 12 | 2008 | 44 | |
| 13 | 2008 | 43 | |
| 14 | 2006 | 36 | |
| 15 | 1985 | 25 | |
| 16 | 1985 | 23 | |
| 17 | 2008 | 23 | |
| 18 | 1995 | 22 | |
| 19 | 1990 | 17 | |
| 20 | 1989 | 16 |
About M.P. Baze
M.P. Baze is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Computational Mechanics, Ceramics and Composites and Biomedical Engineering, having authored 31 papers that have together received 1.3k indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (19 papers), Radiation Effects in Electronics (19 papers), Semiconductor materials and devices (18 papers), VLSI and Analog Circuit Testing (8 papers), Electrostatic Discharge in Electronics (8 papers), Advancements in Semiconductor Devices and Circuit Design (6 papers), Low-power high-performance VLSI design (5 papers) and Physical Unclonable Functions (PUFs) and Hardware Security (2 papers). The work is most often cited by research in Hardware and Architecture (666 citations), Electrical and Electronic Engineering (1.3k citations), Radiation (45 citations), Safety, Risk, Reliability and Quality (31 citations) and Nuclear and High Energy Physics (31 citations). M.P. Baze has collaborated with scholars based in United States, France and Canada. Frequent co-authors include S. Büchner, Dale McMorrow, A.H. Johnston, L. W. Massengill, Oluwole A. Amusan, B. L. Bhuva, Joseph S. Melinger, David J. Brown, Jeffrey D. Black and Andrew L. Sternberg. Their work appears in journals such as IEEE Transactions on Nuclear Science, IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Very Large Scale Integration (VLSI) Systems and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.