Rich Wise
Impact in
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- Semiconductor materials and devices
- Plasma Diagnostics and Applications
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
Papers in
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- Advancements in Photolithography Techniques 12
- Semiconductor materials and devices 6
- Integrated Circuits and Semiconductor Failure Analysis 6
- Plasma Diagnostics and Applications 2
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- Advanced Surface Polishing Techniques 5
- Nanofabrication and Lithography Techniques 2
- Co-authors
- Keren J. Kanarik (1 shared paper)Kazuo Nojiri (1 shared paper)Samantha Tan (2 shared papers)Ivan L. Berry (1 shared paper)Taeseung Kim (1 shared paper)Wenbing Yang (1 shared paper)Jeffrey M. Marks (1 shared paper)Yang Pan (1 shared paper)
- Journals
- Journal of Micro/Nanolithography MEMS and MOEMS (2 papers)IBM Journal of Research and Development (1 paper)IEEE Transactions on Semiconductor Manufacturing (1 paper)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (5 papers)
- Partner nations
- United StatesBelgiumNetherlands
In The Last Decade
Rich Wise
13 papers receiving 178 citations
Peers
Comparison fields: 5 of 24
- Electrical and Electronic Engineering 184
- Surfaces, Coatings and Films 18
- Mechanics of Materials 36
- Condensed Matter Physics 16
- Materials Chemistry 54
Countries citing papers authored by Rich Wise
This map shows the geographic impact of Rich Wise's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Rich Wise with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Rich Wise more than expected).
Fields of papers citing papers by Rich Wise
This network shows the impact of papers produced by Rich Wise. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Rich Wise. The network helps show where Rich Wise may publish in the future.
Co-authors
The 25 scholars most cited alongside Rich Wise, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2017 | 98 | |
| 2 | 1999 | 42 | |
| 3 | 2021 | 11 | |
| 4 | 2017 | 11 | |
| 5 | 2016 | 10 | |
| 6 | 2015 | 4 | |
| 7 | 2017 | 4 | |
| 8 | 2016 | 3 | |
| 9 | 2013 | 3 | |
| 10 | 2018 | 3 | |
| 11 | 2014 | 2 | |
| 12 | 2012 | 2 | |
| 13 | 2019 | 1 | |
| 14 | 2025 | 0 | |
| 15 | 2019 | 0 | |
| 16 | 2025 | 0 |
About Rich Wise
Rich Wise is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Surfaces, Coatings and Films, Mechanics of Materials and Computational Mechanics, having authored 16 papers that have together received 194 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (12 papers), Semiconductor materials and devices (6 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Advanced Surface Polishing Techniques (5 papers), Electron and X-Ray Spectroscopy Techniques (3 papers), Metal and Thin Film Mechanics (2 papers), Nanofabrication and Lithography Techniques (2 papers) and Plasma Diagnostics and Applications (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (184 citations), Surfaces, Coatings and Films (18 citations), Mechanics of Materials (36 citations), Condensed Matter Physics (16 citations) and Materials Chemistry (54 citations). Rich Wise has collaborated with scholars based in United States, Belgium and Netherlands. Frequent co-authors include Keren J. Kanarik, Kazuo Nojiri, Samantha Tan, Ivan L. Berry, Taeseung Kim, Wenbing Yang, Jeffrey M. Marks, Yang Pan, Thorsten Lill and Richard A. Gottscho. Their work appears in journals such as Journal of Micro/Nanolithography MEMS and MOEMS, IBM Journal of Research and Development, IEEE Transactions on Semiconductor Manufacturing, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.