Per‐Erik Hellström

1.0k citations

105 papers · 860 · h-index 17

Impact in

Electrical and Electronic Engineering top 5%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Ferroelectric and Negative Capacitance Devices
Atomic and Molecular Physics, and Optics top 10%
- Semiconductor materials and interfaces

Papers in

Electrical and Electronic Engineering 102
- Semiconductor materials and devices 72
- Advancements in Semiconductor Devices and Circuit Design 66
- Ferroelectric and Negative Capacitance Devices 22
- Integrated Circuits and Semiconductor Failure Analysis 19
- Silicon Carbide Semiconductor Technologies 11
- Silicon and Solar Cell Technologies 10
Atomic and Molecular Physics, and Optics 29
- Semiconductor materials and interfaces 26

Co-authors: Mikael Östling (93 shared papers)B. Gunnar Malm (19 shared papers)E. Dentoni Litta (21 shared papers)Henry H. Radamson (9 shared papers)Martin von Haartman (13 shared papers)Carl‐Mikael Zetterling (6 shared papers)S. Hou (6 shared papers)Christoph Henkel (10 shared papers)
Journals: Solid-State Electronics (12 papers)IEEE Electron Device Letters (9 papers)IEEE Transactions on Electron Devices (6 papers)Microelectronic Engineering (6 papers)IEEE Journal of the Electron Devices Society (4 papers)
Partner nations: Sweden United Kingdom Germany

In The Last Decade

Per‐Erik Hellström

103 papers receiving 806 citations

Peers

Countries citing papers authored by Per‐Erik Hellström

Since Specialization

Citations

This map shows the geographic impact of Per‐Erik Hellström's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Per‐Erik Hellström with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Per‐Erik Hellström more than expected).

Fields of papers citing papers by Per‐Erik Hellström

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Per‐Erik Hellström. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Per‐Erik Hellström. The network helps show where Per‐Erik Hellström may publish in the future.

Co-authors

The 25 scholars most cited alongside Per‐Erik Hellström, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Per‐Erik Hellström Line = papers co-authored together Per‐Erik Hellström links everyone, so they are left out of the graph.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Showing the 20 most-cited of 105 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Lateral encroachment of Ni-silicides in the source/drain regions on ultrathin silicon-on-insulator Applied Physics Letters ·J. Seger, Per‐Erik Hellström, Jun Lü, B. Gunnar Malm, Martin von Haartman, Mikael Östling, S.-L. Zhang	2005	37
2	550 °C 4H-SiC p-i-n Photodiode Array With Two-Layer Metallization IEEE Electron Device Letters ·S. Hou, Per‐Erik Hellström, Carl‐Mikael Zetterling, Mikael Östling	2016	34
3	Sidewall transfer lithography for reliable fabrication of nanowires and deca-nanometer MOSFETs Thin Solid Films ·Julius Hållstedt, Per‐Erik Hellström, Henry H. Radamson	2008	30
4	A robust spacer gate process for deca-nanometer high-frequency MOSFETs Microelectronic Engineering ·Julius Hållstedt, Per‐Erik Hellström, Z. Zhang, B. Gunnar Malm, J. Edholm, Jun Lu, S.-L. Zhang, Henry H. Radamson, Mikael Östling	2005	29
5	Reduced self-heating by strained silicon substrate engineering Applied Surface Science ·A.G. O’Neill, R. Agaiby, Sarah H. Olsen, Yanbin Yang, Per‐Erik Hellström, Mikael Östling, Michael Oehme, K. Lyutovich, E. Kasper, Geert Eneman, P. Verheyen, Roger Loo, C. Claeys, C. Fiegna, E. Sangiorgi	2008	29
6	A novel strained Si/sub 0.7/Ge/sub 0.3/ surface-channel pMOSFET with an ALD TiN/Al/sub 2/O/sub 3//HfAlO/sub x//Al/sub 2/O₃ gate stack IEEE Electron Device Letters ·Depei Wu, A.-C. Lindgren, Stefan Persson, Gustaf Sjöblom, Martin von Haartman, J. Seger, Per‐Erik Hellström, Jörgen Olsson, Hans‐Olof Blom, S.-L. Zhang, Mikael Östling, E. Vainonen-Ahlgren, W.-M. Li, E. Tois, M. Tuominen	2003	28
7	Performance Fluctuation of FinFETs With Schottky Barrier Source/Drain IEEE Electron Device Letters ·Zhen Zhang, Jun Lü, Zhi‐Jun Qiu, Per‐Erik Hellström, Mikael Östling, Shi‐Li Zhang	2008	25
8	Characterization of transfer-bonded silicon bolometer arrays Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Frank Niklaus, J. Pejnefors, Matteo Dainese, Michael Haggblad, Per‐Erik Hellström, Ulf J. Wallgren, Göran Stemme	2004	25
9	Effects of Carbon on Schottky Barrier Heights of NiSi Modified by Dopant Segregation IEEE Electron Device Letters ·Jun Luo, Zhi‐Jun Qiu, D.W. Zhang, Per‐Erik Hellström, Mikael Östling, (unknown)	2009	24
10	Hole effective mass in silicon inversion layers with different substrate orientations and channel directions Journal of Applied Physics ·Luca Donetti, F. Gámiz, S. Thomas, T. E. Whall, D. R. Leadley, Per‐Erik Hellström, G. Malm, Mikael Östling	2011	23
11	Low-frequency noise and Coulomb scattering in Si0.8Ge0.2 surface channel pMOSFETs with ALD Al2O3 gate dielectrics Solid-State Electronics ·Martin von Haartman, Jörgen Westlinder, Depei Wu, B. Gunnar Malm, Per‐Erik Hellström, Jörgen Olsson, Mikael Östling	2005	21
12	Thulium Silicate Interfacial Layer for Scalable High-k/Metal Gate Stacks IEEE Transactions on Electron Devices ·E. Dentoni Litta, Per‐Erik Hellström, Christoph Henkel, Mikael Östling	2013	19
13	Impact of strain and channel orientation on the low-frequency noise performance of Si n- and pMOSFETs Solid-State Electronics ·Martin von Haartman, B. Gunnar Malm, Per‐Erik Hellström, Mikael Östling, T. J. Grasby, T. E. Whall, E. H. C. Parker, K. Lyutovich, Michael Oehme, E. Kasper	2007	18
14	High-Deposition-Rate Atomic Layer Deposition of Thulium Oxide from TmCp₃and H₂O Journal of The Electrochemical Society ·E. Dentoni Litta, Per‐Erik Hellström, Christoph Henkel, Sven Valerio, Anders Hallén, Mikael Östling	2013	17
15	Silicon nanowires integrated with CMOS circuits for biosensing application Solid-State Electronics ·Ganesh Jayakumar, Ali Asadollahi, Per‐Erik Hellström, Konstantinos Garidis, Mikael Östling	2014	17
16	Control of Self-Heating in Thin Virtual Substrate Strained Si MOSFETs IEEE Transactions on Electron Devices ·Sarah H. Olsen, Enrique Escobedo‐Cousin, John B. Varzgar, R. Agaiby, J. Seger, P. Dobrosz, Sanatan Chattopadhyay, S.J. Bull, A.G. O’Neill, Per‐Erik Hellström, J. Edholm, Mikael Östling, K. Lyutovich, Michael Oehme, E. Kasper	2006	16
17	On the electron mobility enhancement in biaxially strained Si MOSFETs Solid-State Electronics ·F. Driussi, David Esseni, L. Selmi, Per‐Erik Hellström, G. Malm, J. Ha ̊llstedt, Mikael Östling, T. J. Grasby, D. R. Leadley, Xavier Mescot	2007	16
18	A Silicon Carbide 256 Pixel UV Image Sensor Array Operating at 400 °C IEEE Journal of the Electron Devices Society ·S. Hou, Muhammad Shakir, Per‐Erik Hellström, B. Gunnar Malm, Carl‐Mikael Zetterling, Mikael Östling	2020	15
19	A 4H-SiC BJT as a Switch for On-Chip Integrated UV Photodiode IEEE Electron Device Letters ·S. Hou, Per‐Erik Hellström, Carl‐Mikael Zetterling, Mikael Östling	2018	15
20	Nanoscaling of MOSFETs and the implementation of Schottky barrier S/D contacts Mikael Östling, Jun Luo, Valur Gudmundsson, Per‐Erik Hellström, B. Gunnar Malm	2010	14

About Per‐Erik Hellström

Per‐Erik Hellström is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Biomedical Engineering, Materials Chemistry and Bioengineering, having authored 105 papers that have together received 860 indexed citations. Recurring topics across this work include Semiconductor materials and devices (72 papers), Advancements in Semiconductor Devices and Circuit Design (66 papers), Semiconductor materials and interfaces (26 papers), Ferroelectric and Negative Capacitance Devices (22 papers), Integrated Circuits and Semiconductor Failure Analysis (19 papers), Nanowire Synthesis and Applications (16 papers), Silicon Carbide Semiconductor Technologies (11 papers) and Silicon and Solar Cell Technologies (10 papers). The work is most often cited by research in Electrical and Electronic Engineering (767 citations), Atomic and Molecular Physics, and Optics (212 citations), Biomedical Engineering (176 citations), Bioengineering (22 citations) and Condensed Matter Physics (44 citations). Per‐Erik Hellström has collaborated with scholars based in Sweden, United Kingdom and Germany. Frequent co-authors include Mikael Östling, B. Gunnar Malm, E. Dentoni Litta, Henry H. Radamson, Martin von Haartman, Carl‐Mikael Zetterling, S. Hou, Christoph Henkel, Shi‐Li Zhang and Jun Lü. Their work appears in journals such as Solid-State Electronics, IEEE Electron Device Letters, IEEE Transactions on Electron Devices, Microelectronic Engineering and IEEE Journal of the Electron Devices Society.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Per‐Erik Hellström

Impact in

Papers in i

In The Last Decade

Per‐Erik Hellström

Peers

Countries citing papers authored by Per‐Erik Hellström

Fields of papers citing papers by Per‐Erik Hellström

All Works

About Per‐Erik Hellström

Explore authors with similar magnitude of impact

Papers in