Mathias Rommel

1.9k citations
147 papers · 1.4k · h-index 19

Impact in

Papers in

    • Silicon Carbide Semiconductor Technologies 52
    • Semiconductor materials and devices 48
    • Integrated Circuits and Semiconductor Failure Analysis 29
    • Thin-Film Transistor Technologies 20
    • Silicon and Solar Cell Technologies 14
    • Nanofabrication and Lithography Techniques 19

Mathias Rommel

129 papers receiving 1.4k citations

Peers

Mathias Rommel
Comparison fields: 5 of 73
  • Structural Biology 33
  • Electrical and Electronic Engineering 966
  • Biomedical Engineering 519
  • Surfaces, Coatings and Films 79
  • Atomic and Molecular Physics, and Optics 329
Replace Anton J. Bauer with:
Anton J. Bauer Germany
W. I. Milne United Kingdom
Jinho Ahn South Korea
Andreas Steiger‐Thirsfeld Austria
Marina S. Leite United States
D. Mariolle France
Ahmed Samir Egypt
Zhengmei Yang China
Hisato Ogiso Japan
Henning Galinski Switzerland
Mathias Rommel relative to Anton J. Bauer Germany Anton J. Bauer's profile →
Citations per field
00.5×1.5×1.9×
Anton J. Bauer · 1×
Citations per year

Countries citing papers authored by Mathias Rommel

Since Specialization
Citations

This map shows the geographic impact of Mathias Rommel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mathias Rommel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mathias Rommel more than expected).

Fields of papers citing papers by Mathias Rommel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Mathias Rommel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mathias Rommel. The network helps show where Mathias Rommel may publish in the future.

Co-authors

The 25 scholars most cited alongside Mathias Rommel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Mathias Rommel Line = papers co-authored together Mathias Rommel links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 147 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2018137
2 2015133
3 200872
4 199961
5 200740
6 201037
7 200930
8 201230
9 201529
10 202128
11 202023
12 200822
13 202021
14 200921
15 201720
16 201420
17 201820
18 200820
19 201819
20 202018

About Mathias Rommel

Mathias Rommel is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry and Computational Mechanics, having authored 147 papers that have together received 1.4k indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (52 papers), Semiconductor materials and devices (48 papers), Integrated Circuits and Semiconductor Failure Analysis (29 papers), Force Microscopy Techniques and Applications (21 papers), Thin-Film Transistor Technologies (20 papers), Nanofabrication and Lithography Techniques (19 papers), Semiconductor materials and interfaces (14 papers) and Silicon and Solar Cell Technologies (14 papers). The work is most often cited by research in Structural Biology (33 citations), Electrical and Electronic Engineering (966 citations), Biomedical Engineering (519 citations), Surfaces, Coatings and Films (79 citations) and Atomic and Molecular Physics, and Optics (329 citations). Mathias Rommel has collaborated with scholars based in Germany, China and Austria. Frequent co-authors include Anton J. Bauer, L. Frey, Zongwei Xu, Fengzhou Fang, Ying Song, H. Ryssel, Tobias Erlbacher, Alexander Hartmaier, Silke Christiansen and Sara Jäckle. Their work appears in journals such as Microelectronic Engineering, Journal of Applied Physics, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Applied Physics Letters and Microelectronics Reliability.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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