M. Eller
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Radiation Effects in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Low-power high-performance VLSI design
- Electrostatic Discharge in Electronics
- Advanced Memory and Neural Computing
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- VLSI and Analog Circuit Testing
Papers in
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- Semiconductor materials and devices 11
- Advancements in Semiconductor Devices and Circuit Design 11
- Ferroelectric and Negative Capacitance Devices 3
- Silicon Carbide Semiconductor Technologies 2
- Integrated Circuits and Semiconductor Failure Analysis 2
- Radiation Effects in Electronics 1
- Co-authors
- Srikanth Samavedam (5 shared papers)M. King (1 shared paper)Xiaogang Wu (1 shared paper)T. D. Haeffner (1 shared paper)M.R. Shaneyfelt (1 shared paper)Michael L. Alles (1 shared paper)T.L. Meisenheimer (1 shared paper)L. W. Massengill (1 shared paper)
- Journals
- IEEE Electron Device Letters (2 papers)ACS Applied Electronic Materials (1 paper)IEEE Transactions on Semiconductor Manufacturing (1 paper)IEEE Transactions on Nuclear Science (1 paper)European Solid-State Device Research Conference (1 paper)
- Partner nations
- United StatesGermanyMalta
In The Last Decade
M. Eller
11 papers receiving 132 citations
Peers
Comparison fields: 5 of 10
- Electrical and Electronic Engineering 137
- Hardware and Architecture 8
- Biomedical Engineering 10
- Industrial and Manufacturing Engineering 2
- Surfaces, Coatings and Films 1
Countries citing papers authored by M. Eller
This map shows the geographic impact of M. Eller's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Eller with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Eller more than expected).
Fields of papers citing papers by M. Eller
This network shows the impact of papers produced by M. Eller. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Eller. The network helps show where M. Eller may publish in the future.
Co-authors
The 25 scholars most cited alongside M. Eller, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2016 | 60 | |
| 2 | 2002 | 24 | |
| 3 | 2007 | 12 | |
| 4 | 2017 | 11 | |
| 5 | 2014 | 8 | |
| 6 | 1999 | 6 | |
| 7 | 2014 | 6 | |
| 8 | 2015 | 5 | |
| 9 | Fabrication and Electrical Characterization of SI/SIGE P-Channel MOSFETs with a Delta Doped Boron Layer | 1996 | 3 |
| 10 | 2016 | 2 | |
| 11 | 2009 | 1 | |
| 12 | 2025 | 0 |
About M. Eller
M. Eller is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics, Hardware and Architecture, Electronic, Optical and Magnetic Materials and Biomedical Engineering, having authored 12 papers that have together received 138 indexed citations. Recurring topics across this work include Semiconductor materials and devices (11 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers), Ferroelectric and Negative Capacitance Devices (3 papers), Silicon Carbide Semiconductor Technologies (2 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers), Acoustic Wave Resonator Technologies (1 paper), VLSI and Analog Circuit Testing (1 paper) and Radiation Effects in Electronics (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (137 citations), Hardware and Architecture (8 citations), Biomedical Engineering (10 citations), Industrial and Manufacturing Engineering (2 citations) and Surfaces, Coatings and Films (1 citation). M. Eller has collaborated with scholars based in United States, Germany and Malta. Frequent co-authors include Srikanth Samavedam, M. King, Xiaogang Wu, T. D. Haeffner, M.R. Shaneyfelt, Michael L. Alles, T.L. Meisenheimer, L. W. Massengill, Dennis R. Ball and J. Félix. Their work appears in journals such as IEEE Electron Device Letters, ACS Applied Electronic Materials, IEEE Transactions on Semiconductor Manufacturing, IEEE Transactions on Nuclear Science and European Solid-State Device Research Conference.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.