J.P. Spratt
Impact in
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- Semiconductor materials and devices
- Radiation Effects in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Silicon and Solar Cell Technologies
- Chalcogenide Semiconductor Thin Films
- CCD and CMOS Imaging Sensors
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- Semiconductor materials and interfaces
Papers in
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- Radiation Effects in Electronics 6
- Semiconductor materials and devices 5
- Advanced Semiconductor Detectors and Materials 4
- Integrated Circuits and Semiconductor Failure Analysis 4
- Silicon and Solar Cell Technologies 3
- CCD and CMOS Imaging Sensors 3
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- Semiconductor materials and interfaces 3
- Co-authors
- George C. Messenger (1 shared paper)R. E. Leadon (7 shared papers)I. H. Khan (1 shared paper)G.L. Schnable (3 shared papers)J.C. Pickel (2 shared papers)Joseph D. Lichtenhan (1 shared paper)Bruce X. Fu (1 shared paper)E.A. Burke (1 shared paper)
- Journals
- IEEE Transactions on Nuclear Science (6 papers)IEEE Transactions on Electron Devices (2 papers)Journal of The Electrochemical Society (1 paper)IEEE Journal of Solid-State Circuits (1 paper)Physical Review Letters (1 paper)
- Partner nations
- United States
In The Last Decade
J.P. Spratt
16 papers receiving 342 citations
Peers
Comparison fields: 5 of 40
- Electrical and Electronic Engineering 323
- Atomic and Molecular Physics, and Optics 85
- Radiation 20
- Materials Chemistry 103
- Instrumentation 6
Countries citing papers authored by J.P. Spratt
This map shows the geographic impact of J.P. Spratt's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.P. Spratt with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.P. Spratt more than expected).
Fields of papers citing papers by J.P. Spratt
This network shows the impact of papers produced by J.P. Spratt. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.P. Spratt. The network helps show where J.P. Spratt may publish in the future.
Co-authors
The 18 scholars most cited alongside J.P. Spratt, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1958 | 128 | |
| 2 | 1961 | 51 | |
| 3 | 1966 | 41 | |
| 4 | 1966 | 40 | |
| 5 | 1968 | 27 | |
| 6 | 2002 | 21 | |
| 7 | 1997 | 13 | |
| 8 | 2005 | 10 | |
| 9 | 2005 | 9 | |
| 10 | 2003 | 8 | |
| 11 | 1973 | 7 | |
| 12 | 2002 | 7 | |
| 13 | 1970 | 6 | |
| 14 | 2001 | 6 | |
| 15 | 2006 | 5 | |
| 16 | 1973 | 2 | |
| 17 | 1969 | 1 | |
| 18 | 2002 | 1 | |
| 19 | 1977 | 0 |
About J.P. Spratt
J.P. Spratt is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Aerospace Engineering, Materials Chemistry and Instrumentation, having authored 19 papers that have together received 383 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (6 papers), Semiconductor materials and devices (5 papers), Advanced Semiconductor Detectors and Materials (4 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Semiconductor materials and interfaces (3 papers), Infrared Target Detection Methodologies (3 papers), Silicon and Solar Cell Technologies (3 papers) and CCD and CMOS Imaging Sensors (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (323 citations), Atomic and Molecular Physics, and Optics (85 citations), Radiation (20 citations), Materials Chemistry (103 citations) and Instrumentation (6 citations). J.P. Spratt has collaborated with scholars based in United States. Frequent co-authors include George C. Messenger, R. E. Leadon, I. H. Khan, G.L. Schnable, J.C. Pickel, Joseph D. Lichtenhan, Bruce X. Fu, E.A. Burke, R.C. Lacoe and H. Clark. Their work appears in journals such as IEEE Transactions on Nuclear Science, IEEE Transactions on Electron Devices, Journal of The Electrochemical Society, IEEE Journal of Solid-State Circuits and Physical Review Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.