Xiaoling Li
Impact in
- Pollution top 10%
- Wastewater Treatment and Nitrogen Removal
- General Energy top 10%
Papers in
-
- Silicon Carbide Semiconductor Technologies 19
- Electromagnetic Compatibility and Noise Suppression 12
- Advanced DC-DC Converters 8
- HVDC Systems and Fault Protection 5
- Semiconductor materials and devices 4
-
- Metal and Thin Film Mechanics 5
- Co-authors
- Zheng Zeng (5 shared papers)Yongzhen Peng (2 shared papers)Yinming Fan (2 shared papers)Jianwen Wei (2 shared papers)Lei Liao (2 shared papers)Xiaobin zhou (2 shared papers)Hongqiang Wang (2 shared papers)Nanqi Ren (1 shared paper)
- Journals
- IEEE Transactions on Power Electronics (4 papers)Surface and Coatings Technology (2 papers)Review of Scientific Instruments (2 papers)IEEE Transactions on Device and Materials Reliability (2 papers)Thin Solid Films (1 paper)
- Partner nations
- ChinaUnited StatesHong Kong
In The Last Decade
Xiaoling Li
53 papers receiving 1.0k citations
Peers
Comparison fields: 5 of 87
- Pollution 147
- General Energy 11
- Building and Construction 117
- Mechanical Engineering 293
- Electrical and Electronic Engineering 395
Countries citing papers authored by Xiaoling Li
This map shows the geographic impact of Xiaoling Li's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Xiaoling Li with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Xiaoling Li more than expected).
Fields of papers citing papers by Xiaoling Li
This network shows the impact of papers produced by Xiaoling Li. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Xiaoling Li. The network helps show where Xiaoling Li may publish in the future.
Co-authors
The 25 scholars most cited alongside Xiaoling Li, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 61 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2014 | 177 | |
| 2 | 2020 | 125 | |
| 3 | 2021 | 78 | |
| 4 | 2017 | 75 | |
| 5 | CEPC-SPPC Preliminary Conceptual Design Report. 1. Physics and Detector | 2015 | 55 |
| 6 | 2006 | 35 | |
| 7 | 2020 | 31 | |
| 8 | 2015 | 29 | |
| 9 | 2022 | 29 | |
| 10 | 2018 | 29 | |
| 11 | 2010 | 28 | |
| 12 | 2024 | 25 | |
| 13 | 2006 | 24 | |
| 14 | 2022 | 23 | |
| 15 | 2014 | 22 | |
| 16 | 2018 | 19 | |
| 17 | 2022 | 19 | |
| 18 | 2024 | 17 | |
| 19 | 2019 | 15 | |
| 20 | 2022 | 15 |
About Xiaoling Li
Xiaoling Li is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials, Materials Chemistry, Civil and Structural Engineering and Mechanical Engineering, having authored 61 papers that have together received 1.0k indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (19 papers), Electromagnetic Compatibility and Noise Suppression (12 papers), Advanced DC-DC Converters (8 papers), HVDC Systems and Fault Protection (5 papers), Metal and Thin Film Mechanics (5 papers), Diamond and Carbon-based Materials Research (4 papers), Semiconductor materials and devices (4 papers) and Aluminum Alloy Microstructure Properties (3 papers). The work is most often cited by research in Pollution (147 citations), General Energy (11 citations), Building and Construction (117 citations), Mechanical Engineering (293 citations) and Electrical and Electronic Engineering (395 citations). Xiaoling Li has collaborated with scholars based in China, United States and Hong Kong. Frequent co-authors include Zheng Zeng, Yongzhen Peng, Yinming Fan, Jianwen Wei, Lei Liao, Xiaobin zhou, Hongqiang Wang, Nanqi Ren, Liang Zhang and Baikun Li. Their work appears in journals such as IEEE Transactions on Power Electronics, Surface and Coatings Technology, Review of Scientific Instruments, IEEE Transactions on Device and Materials Reliability and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.