John Lannon
Impact in
Papers in
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- 3D IC and TSV technologies 13
- Electronic Packaging and Soldering Technologies 10
- CCD and CMOS Imaging Sensors 10
- Advanced Semiconductor Detectors and Materials 7
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- Infrared Target Detection Methodologies 12
- Calibration and Measurement Techniques 7
- Co-authors
- John Walsh (6 shared papers)Alan Huffman (17 shared papers)Matthew Lueck (11 shared papers)D. Temple (13 shared papers)Christopher W. Gregory (6 shared papers)Scott Goodwin (13 shared papers)Liam Murray (1 shared paper)Gabriela Avram (1 shared paper)
- Journals
- Knowledge Management Research & Practice (2 papers)International Journal of Project Management (2 papers)Journal of Magnetism and Magnetic Materials (1 paper)Information Development (1 paper)IEEE Transactions on Components Packaging and Manufacturing Technology (1 paper)
- Partner nations
- United StatesIrelandUnited Kingdom
In The Last Decade
John Lannon
40 papers receiving 385 citations
Peers
Comparison fields: 5 of 80
- Instrumentation 15
- Business and International Management 8
- Electrical and Electronic Engineering 213
- Strategy and Management 52
- Management of Technology and Innovation 20
Countries citing papers authored by John Lannon
This map shows the geographic impact of John Lannon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John Lannon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John Lannon more than expected).
Fields of papers citing papers by John Lannon
This network shows the impact of papers produced by John Lannon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John Lannon. The network helps show where John Lannon may publish in the future.
Co-authors
The 25 scholars most cited alongside John Lannon, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 47 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2009 | 38 | |
| 2 | 2019 | 37 | |
| 3 | 2016 | 30 | |
| 4 | 2019 | 25 | |
| 5 | 2009 | 20 | |
| 6 | 2020 | 17 | |
| 7 | 2020 | 16 | |
| 8 | 2007 | 15 | |
| 9 | 2009 | 15 | |
| 10 | 2016 | 14 | |
| 11 | 2019 | 11 | |
| 12 | 2008 | 11 | |
| 13 | 2014 | 11 | |
| 14 | 2013 | 10 | |
| 15 | 2012 | 10 | |
| 16 | 2014 | 10 | |
| 17 | 2017 | 9 | |
| 18 | 2015 | 8 | |
| 19 | 2013 | 8 | |
| 20 | 2016 | 7 |
About John Lannon
John Lannon is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering, Biomedical Engineering, Sociology and Political Science and Communication, having authored 47 papers that have together received 415 indexed citations. Recurring topics across this work include 3D IC and TSV technologies (13 papers), Infrared Target Detection Methodologies (12 papers), Electronic Packaging and Soldering Technologies (10 papers), CCD and CMOS Imaging Sensors (10 papers), Calibration and Measurement Techniques (7 papers), Advanced Semiconductor Detectors and Materials (7 papers), Nanofabrication and Lithography Techniques (5 papers) and Knowledge Management and Sharing (3 papers). The work is most often cited by research in Instrumentation (15 citations), Business and International Management (8 citations), Electrical and Electronic Engineering (213 citations), Strategy and Management (52 citations) and Management of Technology and Innovation (20 citations). John Lannon has collaborated with scholars based in United States, Ireland and United Kingdom. Frequent co-authors include John Walsh, Alan Huffman, Matthew Lueck, D. Temple, Christopher W. Gregory, Scott Goodwin, Liam Murray, Gabriela Avram, Sheila Killian and Caroline Khene. Their work appears in journals such as Knowledge Management Research & Practice, International Journal of Project Management, Journal of Magnetism and Magnetic Materials, Information Development and IEEE Transactions on Components Packaging and Manufacturing Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.