John Lannon

556 citations
42 papers · 395 · h-index 12

Impact in

Papers in

    • 3D IC and TSV technologies 12
    • CCD and CMOS Imaging Sensors 10
    • Electronic Packaging and Soldering Technologies 9
    • Advanced Semiconductor Detectors and Materials 7
    • Infrared Target Detection Methodologies 12
    • Calibration and Measurement Techniques 7

John Lannon

39 papers receiving 365 citations

Peers

John Lannon
Comparison fields: 5 of 76
  • Instrumentation 15
  • Electrical and Electronic Engineering 211
  • Strategy and Management 51
  • Business and International Management 6
  • Aerospace Engineering 58
Replace Feifei Ren with:
Feifei Ren China
Chun Lei United States
Sanghoon Ahn South Korea
Jaehee Park South Korea
Zelin Zhang China
Peter McInnes United Kingdom
William S. C. Chang United States
Soon Jae Kwon South Korea
Thavamaran Kanesan Malaysia
Tingling Lin China
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Citations per field
00.5×3.8×
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Citations per year

Countries citing papers authored by John Lannon

Since Specialization
Citations

This map shows the geographic impact of John Lannon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John Lannon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John Lannon more than expected).

Fields of papers citing papers by John Lannon

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by John Lannon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John Lannon. The network helps show where John Lannon may publish in the future.

Co-authors

The 25 scholars most cited alongside John Lannon, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with John Lannon Line = papers co-authored together John Lannon links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 42 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200937
2 201931
3 201629
4 201924
5 200920
6 202017
7 202016
8 200715
9 200915
10 201614
11 201911
12 200811
13 201411
14 201310
15 201210
16 201410
17 20158
18 20138
19 20167
20 20137

About John Lannon

John Lannon is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering, Biomedical Engineering, Communication and Strategy and Management, having authored 42 papers that have together received 395 indexed citations. Recurring topics across this work include Infrared Target Detection Methodologies (12 papers), 3D IC and TSV technologies (12 papers), CCD and CMOS Imaging Sensors (10 papers), Electronic Packaging and Soldering Technologies (9 papers), Calibration and Measurement Techniques (7 papers), Advanced Semiconductor Detectors and Materials (7 papers), Nanofabrication and Lithography Techniques (5 papers) and Knowledge Management and Sharing (3 papers). The work is most often cited by research in Instrumentation (15 citations), Electrical and Electronic Engineering (211 citations), Strategy and Management (51 citations), Business and International Management (6 citations) and Aerospace Engineering (58 citations). John Lannon has collaborated with scholars based in United States, Ireland and Germany. Frequent co-authors include John Walsh, Alan Huffman, D. Temple, Matthew Lueck, Scott Goodwin, Christopher W. Gregory, Steve Solomon, Gabriela Avram, Liam Murray and Sheila Killian. Their work appears in journals such as Knowledge Management Research & Practice, International Journal of Project Management, Journal of Knowledge Management, Journal of Magnetism and Magnetic Materials and Information Development.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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