John Armer
Impact in
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- Electrostatic Discharge in Electronics
- Silicon Carbide Semiconductor Technologies
- Advancements in Semiconductor Devices and Circuit Design
- Semiconductor materials and devices
- Low-power high-performance VLSI design
- Radiation Effects in Electronics
- Radio Frequency Integrated Circuit Design
Papers in
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- Electrostatic Discharge in Electronics 10
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- Advanced Optical Sensing Technologies 1
- Co-authors
- M. Mergens (10 shared papers)Koen G. Verhaege (10 shared papers)Phillip C. Jozwiak (10 shared papers)C. Russ (7 shared papers)Bart Keppens (6 shared papers)Christian Russ (2 shared papers)Ranjeet Kumar (1 shared paper)John R. Tower (1 shared paper)
- Journals
- Microelectronics Reliability (3 papers)IEEE Transactions on Device and Materials Reliability (1 paper)Electrical Overstress/Electrostatic Discharge Symposium (3 papers)IEEE Custom Integrated Circuits Conference (CICC) (2 papers)IEEE International Symposium on Circuits and Systems proceedings (1 paper)
- Partner nations
- GermanyUnited StatesFrance
In The Last Decade
John Armer
11 papers receiving 379 citations
Peers
Comparison fields: 5 of 7
- Electrical and Electronic Engineering 426
- Instrumentation 1
- Hardware and Architecture 3
- Numerical Analysis 1
- Signal Processing 1
Countries citing papers authored by John Armer
This map shows the geographic impact of John Armer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John Armer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John Armer more than expected).
Fields of papers citing papers by John Armer
This network shows the impact of papers produced by John Armer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John Armer. The network helps show where John Armer may publish in the future.
Co-authors
The 13 scholars most cited alongside John Armer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | GGSCRs: GGNMOS Triggered silicon controlled rectifiers for ESD protection in deep sub-micron CMOS processes | 2001 | 92 |
| 2 | 2004 | 88 | |
| 3 | 2005 | 81 | |
| 4 | 2003 | 74 | |
| 5 | Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width-scaling | 2001 | 34 |
| 6 | Active-area-segmentation (AAS) technique for compact, ESD robust, fully silicided NMOS design | 2003 | 20 |
| 7 | 2005 | 16 | |
| 8 | 2004 | 13 | |
| 9 | 2003 | 10 | |
| 10 | 2002 | 2 | |
| 11 | 2002 | 1 | |
| 12 | 2016 | 1 |
About John Armer
John Armer is a scholar working on Electrical and Electronic Engineering, Instrumentation, Signal Processing, Nuclear Energy and Engineering and Waste Management and Disposal, having authored 12 papers that have together received 432 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (10 papers), Video Coding and Compression Technologies (1 paper) and Advanced Optical Sensing Technologies (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (426 citations), Instrumentation (1 citation), Hardware and Architecture (3 citations), Numerical Analysis (1 citation) and Signal Processing (1 citation). John Armer has collaborated with scholars based in Germany, United States and France. Frequent co-authors include M. Mergens, Koen G. Verhaege, Phillip C. Jozwiak, C. Russ, Bart Keppens, Christian Russ, Ranjeet Kumar, John R. Tower, Mark Entwistle and Krystyna Slomkowski. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability, Electrical Overstress/Electrostatic Discharge Symposium, IEEE Custom Integrated Circuits Conference (CICC) and IEEE International Symposium on Circuits and Systems proceedings.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.