R.N. Rountree
Impact in
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- Electrostatic Discharge in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Electromagnetic Compatibility and Noise Suppression
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Silicon Carbide Semiconductor Technologies
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- Physical Unclonable Functions (PUFs) and Hardware Security
Papers in
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- Electrostatic Discharge in Electronics 10
- Integrated Circuits and Semiconductor Failure Analysis 7
- Semiconductor materials and devices 6
- Electromagnetic Compatibility and Noise Suppression 5
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- Parallel Computing and Optimization Techniques 2
- Physical Unclonable Functions (PUFs) and Hardware Security 2
- VLSI and Analog Circuit Testing 1
- Co-authors
- C. Duvvury (7 shared papers)Charvaka Duvvury (1 shared paper)Oliver Adams (3 shared papers)David Baglee (1 shared paper)T. Polgreen (1 shared paper)H. Stiegler (1 shared paper)H. Shichijo (2 shared papers)Hoang Vinh Tran (2 shared papers)
- Journals
- IEEE Transactions on Electron Devices (2 papers)IEEE Transactions on Industry Applications (1 paper)Journal of Electrostatics (1 paper)Reliability physics (2 papers)
- Partner nations
- United States
In The Last Decade
R.N. Rountree
11 papers receiving 301 citations
Peers
Comparison fields: 5 of 10
- Electrical and Electronic Engineering 316
- Hardware and Architecture 25
- Astronomy and Astrophysics 5
- Automotive Engineering 1
- Cognitive Neuroscience 1
Countries citing papers authored by R.N. Rountree
This map shows the geographic impact of R.N. Rountree's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.N. Rountree with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.N. Rountree more than expected).
Fields of papers citing papers by R.N. Rountree
This network shows the impact of papers produced by R.N. Rountree. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.N. Rountree. The network helps show where R.N. Rountree may publish in the future.
Co-authors
The 10 scholars most cited alongside R.N. Rountree, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1985 | 69 | |
| 2 | 1992 | 61 | |
| 3 | 1988 | 59 | |
| 4 | 1987 | 36 | |
| 5 | 1989 | 29 | |
| 6 | 1986 | 27 | |
| 7 | 2003 | 18 | |
| 8 | 1989 | 11 | |
| 9 | 1991 | 5 | |
| 10 | 1988 | 3 | |
| 11 | 2003 | 1 | |
| 12 | 2002 | 0 |
About R.N. Rountree
R.N. Rountree is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Computer Networks and Communications, Infectious Diseases and Organic Chemistry, having authored 12 papers that have together received 319 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (10 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Semiconductor materials and devices (6 papers), Electromagnetic Compatibility and Noise Suppression (5 papers), Parallel Computing and Optimization Techniques (2 papers), Advanced Data Storage Technologies (2 papers), Physical Unclonable Functions (PUFs) and Hardware Security (2 papers) and VLSI and Analog Circuit Testing (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (316 citations), Hardware and Architecture (25 citations), Astronomy and Astrophysics (5 citations), Automotive Engineering (1 citation) and Cognitive Neuroscience (1 citation). R.N. Rountree has collaborated with scholars based in United States. Frequent co-authors include C. Duvvury, Charvaka Duvvury, Oliver Adams, David Baglee, T. Polgreen, H. Stiegler, H. Shichijo, Hoang Vinh Tran, Teppei Suzuki and D.B. Scott. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Transactions on Industry Applications, Journal of Electrostatics and Reliability physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.