Bart Keppens
Impact in
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- Electrostatic Discharge in Electronics
- Advancements in Semiconductor Devices and Circuit Design
- Semiconductor materials and devices
- Silicon Carbide Semiconductor Technologies
- Radio Frequency Integrated Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Engineering and Technology Innovations
Papers in
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- Electrostatic Discharge in Electronics 22
- Semiconductor materials and devices 2
- Radiation Effects in Electronics 2
- Integrated Circuits and Semiconductor Failure Analysis 1
- CCD and CMOS Imaging Sensors 1
- Co-authors
- M. Mergens (8 shared papers)Koen G. Verhaege (9 shared papers)Phillip C. Jozwiak (6 shared papers)John Armer (6 shared papers)C. Russ (5 shared papers)G. Groeseneken (7 shared papers)Vincent De Heyn (7 shared papers)Christian Russ (2 shared papers)
- Journals
- Microelectronics Reliability (5 papers)IEEE Transactions on Device and Materials Reliability (1 paper)Electrical Overstress/Electrostatic Discharge Symposium (9 papers)European Solid-State Device Research Conference (1 paper)Technical digest - International Electron Devices Meeting/Technical digest (1 paper)
In The Last Decade
Bart Keppens
24 papers receiving 394 citations
Peers
Comparison fields: 5 of 5
- Electrical and Electronic Engineering 433
- Hardware and Architecture 3
- Numerical Analysis 1
- Biomedical Engineering 4
- Astronomy and Astrophysics 1
Countries citing papers authored by Bart Keppens
This map shows the geographic impact of Bart Keppens's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bart Keppens with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bart Keppens more than expected).
Fields of papers citing papers by Bart Keppens
This network shows the impact of papers produced by Bart Keppens. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bart Keppens. The network helps show where Bart Keppens may publish in the future.
Co-authors
The 20 scholars most cited alongside Bart Keppens, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 24 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 88 | |
| 2 | 2005 | 81 | |
| 3 | 2004 | 57 | |
| 4 | 2002 | 36 | |
| 5 | 2003 | 21 | |
| 6 | Active-area-segmentation (AAS) technique for compact, ESD robust, fully silicided NMOS design | 2003 | 20 |
| 7 | 2005 | 20 | |
| 8 | 2005 | 16 | |
| 9 | 2004 | 13 | |
| 10 | Contributions to standardization of Transmission Line Pulse testing methodology | 2001 | 12 |
| 11 | 2007 | 11 | |
| 12 | 2003 | 10 | |
| 13 | 2001 | 8 | |
| 14 | Concept for body coupling in SOI MOS transistors to improve multi-finger triggering | 2006 | 8 |
| 15 | ESD reliability issues in RF CMOS circuits | 2002 | 7 |
| 16 | 2002 | 5 | |
| 17 | On-chip ESD protection with improved high holding current SCR (HHISCR) achieving IEC 8kV contact system level | 2010 | 5 |
| 18 | 2000 | 4 | |
| 19 | Current detection trigger scheme for SCR based ESD protection of output drivers in CMOS technologies avoiding competitive triggering | 2005 | 4 |
| 20 | CDM analysis on 65nm CMOS: Pitfalls when correlating results between IO test chips and product level | 2008 | 4 |
About Bart Keppens
Bart Keppens is a scholar working on Electrical and Electronic Engineering, Nuclear Energy and Engineering, Waste Management and Disposal, Infectious Diseases and Organic Chemistry, having authored 24 papers that have together received 438 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (22 papers), Semiconductor materials and devices (2 papers), Radiation Effects in Electronics (2 papers), Integrated Circuits and Semiconductor Failure Analysis (1 paper) and CCD and CMOS Imaging Sensors (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (433 citations), Hardware and Architecture (3 citations), Numerical Analysis (1 citation), Biomedical Engineering (4 citations) and Astronomy and Astrophysics (1 citation). Bart Keppens has collaborated with scholars based in Belgium, Germany and Japan. Frequent co-authors include M. Mergens, Koen G. Verhaege, Phillip C. Jozwiak, John Armer, C. Russ, G. Groeseneken, Vincent De Heyn, Christian Russ, Mahadeva Iyer Natarajan and Karlheinz Bock. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability, Electrical Overstress/Electrostatic Discharge Symposium, European Solid-State Device Research Conference and Technical digest - International Electron Devices Meeting/Technical digest.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.