Douglas Yoder

570 citations
3 papers · 505 · 1 hit paper · h-index 3

Impact in

    • X-ray Diffraction in Crystallography
    • ZnO doping and properties
    • Ferroelectric and Piezoelectric Materials
    • Luminescence Properties of Advanced Materials
    • Semiconductor materials and devices
    • Organic Electronics and Photovoltaics

Papers in

Douglas Yoder

3 papers receiving 495 citations

Douglas Yoder's Hit Papers

Effect of nitrogen on band alignment in HfSiON gate dielectrics 2005 · 424 citations
4240+7+14Years since publication100200300400

Peers

Douglas Yoder
Comparison fields: 5 of 45
  • Materials Chemistry 186
  • Electrical and Electronic Engineering 157
  • Electronic, Optical and Magnetic Materials 45
  • Radiation 16
  • Structural Biology 4
Replace S. Valızadeh with:
S. Valızadeh Sweden
Meng-Hsiu Tsai Taiwan
Hemantkumar N. Aiyer India
H. -D. Bauer Germany
Eric Bersch United States
Dariya V. Savchenko Ukraine
Margareta Paunescu United States
Kazushi Sumitani Japan
Célia Castro France
C. B. Samantaray United States
Douglas Yoder relative to S. Valızadeh Sweden S. Valızadeh's profile →
Citations per field
00.5×2×2.9×
S. Valızadeh · 1×
Citations per year

Countries citing papers authored by Douglas Yoder

Since Specialization
Citations

This map shows the geographic impact of Douglas Yoder's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Douglas Yoder with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Douglas Yoder more than expected).

Fields of papers citing papers by Douglas Yoder

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Douglas Yoder. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Douglas Yoder. The network helps show where Douglas Yoder may publish in the future.

Co-authors

The 15 scholars most cited alongside Douglas Yoder, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Douglas Yoder Line = papers co-authored together Douglas Yoder links everyone, so they are left out of the graph.

All Works

3 of 3 papers shown

About Douglas Yoder

Douglas Yoder is a scholar working on Radiation, Materials Chemistry, Electrical and Electronic Engineering, Nuclear Energy and Engineering and Waste Management and Disposal, having authored 3 papers that have together received 505 indexed citations. Recurring topics across this work include Semiconductor materials and devices (1 paper), X-ray Diffraction in Crystallography (1 paper) and X-ray Spectroscopy and Fluorescence Analysis (1 paper). The work is most often cited by research in Materials Chemistry (186 citations), Electrical and Electronic Engineering (157 citations), Electronic, Optical and Magnetic Materials (45 citations), Radiation (16 citations) and Structural Biology (4 citations). Douglas Yoder has collaborated with scholars based in United States. Frequent co-authors include Daniel A. Fischer, Igor Levin, Mark R. Visokay, Özgür Çelık, James R. Ehrstein, Manuel Angel Quevedo-Lopez, Şafak Sayan, Margareta Paunescu, Nhan V. Nguyen and Eric L. Garfunkel. Their work appears in journals such as Physical Review Letters, Applied Physics Letters and Physical Review B.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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