J. D. Benson

2.0k citations

119 papers · 1.6k · h-index 21

Impact in

Electrical and Electronic Engineering top 5%
- Advanced Semiconductor Detectors and Materials
- Chalcogenide Semiconductor Thin Films
- Semiconductor materials and devices
- Advancements in Battery Materials
- Advancements in Semiconductor Devices and Circuit Design
- Advanced Battery Materials and Technologies
Atomic and Molecular Physics, and Optics top 5%
- Semiconductor Quantum Structures and Devices

Papers in

Electrical and Electronic Engineering 110
- Advanced Semiconductor Detectors and Materials 77
- Chalcogenide Semiconductor Thin Films 42
- Semiconductor materials and devices 17
- Advancements in Semiconductor Devices and Circuit Design 12
- Plasma Diagnostics and Applications 9
Atomic and Molecular Physics, and Optics 40
- Semiconductor Quantum Structures and Devices 34

Co-authors: J. H. Dinan (28 shared papers)Blaine Johs (6 shared papers)A. J. Stoltz (40 shared papers)A. Cornfeld (5 shared papers)Craig M. Herzinger (2 shared papers)M. Martinka (29 shared papers)L. A. Almeida (38 shared papers)Christopher J. Summers (10 shared papers)
Journals: Journal of Electronic Materials (61 papers)Journal of Crystal Growth (4 papers)MRS Internet Journal of Nitride Semiconductor Research (2 papers)Journal of Applied Physics (2 papers)Thin Solid Films (2 papers)
Partner nations: United States United Kingdom Netherlands

In The Last Decade

J. D. Benson

118 papers receiving 1.5k citations

Peers

Countries citing papers authored by J. D. Benson

Since Specialization

Citations

This map shows the geographic impact of J. D. Benson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. D. Benson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. D. Benson more than expected).

Fields of papers citing papers by J. D. Benson

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. D. Benson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. D. Benson. The network helps show where J. D. Benson may publish in the future.

Co-authors

The 25 scholars most cited alongside J. D. Benson, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. D. Benson Line = papers co-authored together J. D. Benson links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 119 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Development of a parametric optical constant model for Hg1−xCdxTe for control of composition by spectroscopic ellipsometry during MBE growth Thin Solid Films ·Blaine Johs, Craig M. Herzinger, J. H. Dinan, A. Cornfeld, J. D. Benson	1998	217
2	Comparative study of the solid electrolyte interphase on graphite in full Li-ion battery cells using X-ray photoelectron spectroscopy, secondary ion mass spectrometry, and electron microscopy Carbon ·Jung Tae Lee, Naoki Nitta, J. D. Benson, Alexandre Magasinski, Thomas F. Fuller, Gleb Yushin	2012	84
3	Surface stoichiometry and reaction kinetics of molecular beam epitaxially grown (001) CdTe surfaces Applied Physics Letters ·J. D. Benson, B. K. Wagner, A. Torabi, Christopher J. Summers	1986	64
4	Mechanisms of B deactivation control by F co-implantation Applied Physics Letters ·N. E. B. Cowern, B. Colombeau, J. D. Benson, Andrew J. Smith, W. Lerch, S. Paul, T. Graf, F. Cristiano, X. Hebras, D. Bolze	2005	55
5	Visible-Blind UV Digital Camera Based On a 32 × 32 Array of GaN/AlGaN p-i-n Photodiodes MRS Internet Journal of Nitride Semiconductor Research ·J.D. Brown, Zhonghai Yu, J. Matthews, S. Harney, J. Boney, J. F. Schetzina, J. D. Benson, Kim Dang, C. W. Terrill, Thomas Nohava, Wei Yang, S. Krishnankutty	1999	49
6	Enhancing Cycle Stability of Lithium Iron Phosphate in Aqueous Electrolytes by Increasing Electrolyte Molarity Advanced Energy Materials ·Daniel Gordon, Michelle Yu Wu, Anirudh Ramanujapuram, J. D. Benson, Jung Tae Lee, Alexandre Magasinski, Naoki Nitta, Cindy Huang, Gleb Yushin	2015	45
7	Optoelectronic device performance on reduced threading dislocation density GaAs/Si Journal of Applied Physics ·Patrick J. Taylor, W. A. Jesser, J. D. Benson, M. Martinka, J. H. Dinan, John L. Bradshaw, M. Lara-Taysing, Richard P. Leavitt, George J. Simonis, Wei‐Hsu Chang, William W. Clark, Kris A. Bertness	2001	39
8	Fabrication and characterization of two-color midwavelength/long wavelength HgCdTe infrared detectors Journal of Electronic Materials ·E. P. Smith, E. A. Patten, P. M. Goetz, G. M. Venzor, J. A. Roth, B. Z. Nosho, J. D. Benson, A. J. Stoltz, J. B. Varesi, J. Eric Jensen, S. M. Johnson, W. A. Radford	2006	36
9	The SPEAR-1 experiment: high voltage effects on space charging in the ionosphere IEEE Transactions on Nuclear Science ·D.B. Allred, J. D. Benson, H. A. Cohen, W. J. Raitt, David A. Burt, Ira Katz, G. A. Jongeward, J. A. Antoniades, M. J. Alport, D. A. Boyd, W.C. Nunnally, W.E. Dillon, J. Pickett, R. B. Torbert	1988	30
10	Effects of excess tellurium on the properties of CdZnTe radiation detectors Journal of Electronic Materials ·M. Chu, Sevag Terterian, David Z. Ting, C. C. Wang, J. D. Benson, J. H. Dinan, R. B. James, A. Bürger	2003	29
11	The effect of electron cyclotron resonance plasma parameters on the aspect ratio of trenches in HgCdTe Journal of Electronic Materials ·A. J. Stoltz, J. D. Benson, P. R. Boyd, M. Martinka, J. B. Varesi, A. W. Kaleczyc, E. P. Smith, S. M. Johnson, W. A. Radford, J. H. Dinan	2003	29
12	Characterization of Dislocations in (112)B HgCdTe/CdTe/Si Journal of Electronic Materials ·J. D. Benson, L. O. Bubulac, Peter J. Smith, R. N. Jacobs, J. K. Markunas, M. Jaime-Vasquez, L. A. Almeida, A. J. Stoltz, P. S. Wijewarnasuriya, G. Brill, Y. Chen, U. Lee, M. F. Vilela, Jeffrey M. Peterson, S. M. Johnson, D. D. Lofgreen, David R. Rhiger, E. A. Patten, P. M. Goetz	2010	28
13	Growth and Analysis of HgCdTe on Alternate Substrates Journal of Electronic Materials ·J. D. Benson, L. O. Bubulac, Peter J. Smith, R. N. Jacobs, J. K. Markunas, M. Jaime-Vasquez, L. A. Almeida, A. J. Stoltz, J. M. Arias, G. Brill, Y. Chen, P. S. Wijewarnasuriya, S. Farrell, U. Lee	2012	28
14	Real-time monitoring and control of epitaxial semiconductor growth in a production environment by in situ spectroscopic ellipsometry Thin Solid Films ·Blaine Johs, Craig M. Herzinger, J. H. Dinan, A. Cornfeld, J. D. Benson, D.P. Doctor, G. L. Olson, Ian T. Ferguson, M. Pelczynski, P. P. Chow, C. H. Kuo, S. M. Johnson	1998	25
15	Matching Performance of FinFET Devices With Fin Widths Down to 10 nm IEEE Electron Device Letters ·Paolo Magnone, A. Mercha, V. Subramanian, P. Parvais, Nadine Collaert, M. Dehan, Stefaan Decoutere, G. Groeseneken, J. D. Benson, T. Mérelle, R.J.P. Lander, Felice Crupi, C. Nick Pace	2009	24
16	Structural Analysis of CdTe Hetero-epitaxy on (211) Si Journal of Electronic Materials ·J. D. Benson, R. N. Jacobs, J. K. Markunas, M. Jaime-Vasquez, Peter J. Smith, L. A. Almeida, M. Martinka, M. F. Vilela, U. Lee	2008	23
17	Ten-channel grating polychromator for electron cyclotron emission plasma diagnostics Review of Scientific Instruments ·J. Fischer, D. A. Boyd, A. Cavallo, J. D. Benson	1983	23
18	A physically based compact model of partially depleted SOI MOSFETs for analog circuit simulation IEEE Journal of Solid-State Circuits ·M.S.L. Lee, B.M. Tenbroek, W. Redman-White, J. D. Benson, Michael J. Uren	2001	23
19	Development of a high-selectivity process for electron cyclotron resonance plasma etching of II-VI semiconductors Journal of Electronic Materials ·A. J. Stoltz, J. D. Benson, M. L. Thomas, P. R. Boyd, M. Martinka, J. H. Dinan	2002	22
20	Design and performance of a high density 3D microwave module Rick Sturdivant, Chung Ly, J. D. Benson, M. Hauhe	2002	21

About J. D. Benson

J. D. Benson is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Surfaces, Coatings and Films and Aerospace Engineering, having authored 119 papers that have together received 1.6k indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (77 papers), Chalcogenide Semiconductor Thin Films (42 papers), Semiconductor Quantum Structures and Devices (34 papers), Semiconductor materials and devices (17 papers), Quantum Dots Synthesis And Properties (13 papers), Advancements in Semiconductor Devices and Circuit Design (12 papers), Electron and X-Ray Spectroscopy Techniques (10 papers) and Plasma Diagnostics and Applications (9 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.4k citations), Atomic and Molecular Physics, and Optics (614 citations), Surfaces, Coatings and Films (85 citations), Condensed Matter Physics (106 citations) and Materials Chemistry (407 citations). J. D. Benson has collaborated with scholars based in United States, United Kingdom and Netherlands. Frequent co-authors include J. H. Dinan, Blaine Johs, A. J. Stoltz, A. Cornfeld, Craig M. Herzinger, M. Martinka, L. A. Almeida, Christopher J. Summers, B. K. Wagner and R. N. Jacobs. Their work appears in journals such as Journal of Electronic Materials, Journal of Crystal Growth, MRS Internet Journal of Nitride Semiconductor Research, Journal of Applied Physics and Thin Solid Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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