J. Armer
Impact in
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- Electrostatic Discharge in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Electromagnetic Compatibility and Noise Suppression
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Silicon Carbide Semiconductor Technologies
- Radio Frequency Integrated Circuit Design
-
- Physical Unclonable Functions (PUFs) and Hardware Security
Papers in
-
- Electrostatic Discharge in Electronics 10
- Integrated Circuits and Semiconductor Failure Analysis 7
- Semiconductor materials and devices 5
- Advancements in Semiconductor Devices and Circuit Design 3
- Electromagnetic Compatibility and Noise Suppression 3
- Silicon Carbide Semiconductor Technologies 2
- Co-authors
- K. Verhaege (10 shared papers)P. Jozwiak (10 shared papers)M. Mergens (10 shared papers)C. Russ (7 shared papers)B. Keppens (6 shared papers)Christian Russ (2 shared papers)Ranjeet Kumar (1 shared paper)Benjamin Van Camp (2 shared papers)
- Journals
- Microelectronics Reliability (3 papers)IEEE Transactions on Device and Materials Reliability (1 paper)Electrical Overstress/Electrostatic Discharge Symposium (3 papers)
- Partner nations
- GermanyFranceUnited States
In The Last Decade
J. Armer
11 papers receiving 320 citations
Peers
Comparison fields: 5 of 9
- Electrical and Electronic Engineering 352
- Hardware and Architecture 9
- Instrumentation 1
- Signal Processing 2
- Computer Vision and Pattern Recognition 1
Countries citing papers authored by J. Armer
This map shows the geographic impact of J. Armer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Armer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Armer more than expected).
Fields of papers citing papers by J. Armer
This network shows the impact of papers produced by J. Armer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Armer. The network helps show where J. Armer may publish in the future.
Co-authors
The 17 scholars most cited alongside J. Armer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 84 | |
| 2 | 2005 | 82 | |
| 3 | GGSCRs: GGNMOS Triggered silicon controlled rectifiers for ESD protection in deep sub-micron CMOS processes | 2001 | 61 |
| 4 | 2003 | 37 | |
| 5 | Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width-scaling | 2001 | 35 |
| 6 | Active-area-segmentation (AAS) technique for compact, ESD robust, fully silicided NMOS design | 2003 | 17 |
| 7 | 2005 | 14 | |
| 8 | 2004 | 12 | |
| 9 | 2003 | 10 | |
| 10 | 2002 | 2 | |
| 11 | 2016 | 1 | |
| 12 | 2002 | 0 |
About J. Armer
J. Armer is a scholar working on Electrical and Electronic Engineering, Computer Vision and Pattern Recognition, Instrumentation, Signal Processing and Hardware and Architecture, having authored 12 papers that have together received 355 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (10 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Semiconductor materials and devices (5 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers), Electromagnetic Compatibility and Noise Suppression (3 papers), Silicon Carbide Semiconductor Technologies (2 papers), Optical Imaging and Spectroscopy Techniques (1 paper) and Video Coding and Compression Technologies (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (352 citations), Hardware and Architecture (9 citations), Instrumentation (1 citation), Signal Processing (2 citations) and Computer Vision and Pattern Recognition (1 citation). J. Armer has collaborated with scholars based in Germany, France and United States. Frequent co-authors include K. Verhaege, P. Jozwiak, M. Mergens, C. Russ, B. Keppens, Christian Russ, Ranjeet Kumar, Benjamin Van Camp, Brian Piccione and Mark A. Itzler. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability and Electrical Overstress/Electrostatic Discharge Symposium.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.