James S. Cable

450 citations
22 papers · 355 · h-index 10

Impact in

    • Semiconductor materials and devices
    • Radiation Effects in Electronics
    • Advancements in Semiconductor Devices and Circuit Design
    • Integrated Circuits and Semiconductor Failure Analysis
    • Advanced Memory and Neural Computing

Papers in

    • Semiconductor materials and devices 18
    • Advancements in Semiconductor Devices and Circuit Design 15
    • Integrated Circuits and Semiconductor Failure Analysis 10
    • Radiation Effects in Electronics 4
    • Advanced Memory and Neural Computing 3
    • Electrostatic Discharge in Electronics 2
    • Ferroelectric and Negative Capacitance Devices 2
    • VLSI and Analog Circuit Testing 3

James S. Cable

19 papers receiving 332 citations

Peers

James S. Cable
Comparison fields: 5 of 38
  • Radiation 43
  • Electrical and Electronic Engineering 282
  • Hardware and Architecture 34
  • Instrumentation 10
  • Nuclear and High Energy Physics 30
Replace Troy D. England with:
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Countries citing papers authored by James S. Cable

Since Specialization
Citations

This map shows the geographic impact of James S. Cable's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by James S. Cable with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites James S. Cable more than expected).

Fields of papers citing papers by James S. Cable

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by James S. Cable. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by James S. Cable. The network helps show where James S. Cable may publish in the future.

Co-authors

The 19 scholars most cited alongside James S. Cable, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with James S. Cable Line = papers co-authored together James S. Cable links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 22 papers — load more, or switch the sort, to bring in the rest.

#Work
1 199392
2 198753
3 199138
4 198837
5 199331
6 199219
7 199515
8 199112
9 198611
10 199210
11 199110
12 19937
13 19876
14 19915
15 19863
16 20022
17 19862
18 20021
19
Bias and Temperature Dependence of Hot Carrier Lifetime from 77K to 300K
19921
20 20020

About James S. Cable

James S. Cable is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Nuclear and High Energy Physics, Materials Chemistry and Atomic and Molecular Physics, and Optics, having authored 22 papers that have together received 355 indexed citations. Recurring topics across this work include Semiconductor materials and devices (18 papers), Advancements in Semiconductor Devices and Circuit Design (15 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers), Radiation Effects in Electronics (4 papers), VLSI and Analog Circuit Testing (3 papers), Advanced Memory and Neural Computing (3 papers), Electrostatic Discharge in Electronics (2 papers) and Ferroelectric and Negative Capacitance Devices (2 papers). The work is most often cited by research in Radiation (43 citations), Electrical and Electronic Engineering (282 citations), Hardware and Architecture (34 citations), Instrumentation (10 citations) and Nuclear and High Energy Physics (30 citations). James S. Cable has collaborated with scholars based in United States and South Korea. Frequent co-authors include L. Randall Canfield, Raj S. Korde, J.C.S. Woo, Yu Jun Song, Nasr M. Ghoniem, R Märtin, C.G. Hwang, Jinyoung Olivia Choi, B.J. Sheu and Sudhir M. Gowda. Their work appears in journals such as IEEE Transactions on Nuclear Science, IEEE Transactions on Electron Devices, IEEE Electron Device Letters, IEEE Journal of Solid-State Circuits and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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