Edward Engbrecht

402 citations
17 papers · 334 · h-index 8

Impact in

Papers in

Edward Engbrecht

15 papers receiving 314 citations

Peers

Edward Engbrecht
Comparison fields: 5 of 30
  • Electrical and Electronic Engineering 278
  • Hardware and Architecture 26
  • Electronic, Optical and Magnetic Materials 50
  • Mechanics of Materials 63
  • Materials Chemistry 79
Replace B. Eyckens with:
B. Eyckens Belgium
S.L. Shue Taiwan
R. A. Augur Netherlands
H.F. Luan United States
Daryl Restaino United States
Dinesh Badami United States
Reinhard Schulz United States
Shinji Mori Japan
S. E. Luce United States
Geraldine Jamieson Belgium
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Citations per field
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Citations per year

Countries citing papers authored by Edward Engbrecht

Since Specialization
Citations

This map shows the geographic impact of Edward Engbrecht's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Edward Engbrecht with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Edward Engbrecht more than expected).

Fields of papers citing papers by Edward Engbrecht

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Edward Engbrecht. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Edward Engbrecht. The network helps show where Edward Engbrecht may publish in the future.

Co-authors

The 25 scholars most cited alongside Edward Engbrecht, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Edward Engbrecht Line = papers co-authored together Edward Engbrecht links everyone, so they are left out of the graph.

All Works

17 of 17 papers shown
#Work
1 2014108
2 201271
3 200145
4 200229
5 201628
6 200413
7 200510
8 20049
9 20056
10 20085
11
Evaluation of Cu CMP Barrier Slurries for Ultra Low-k dielectric film (k~2.4) for 45nm technology
20113
12 20153
13 20032
14 20101
15 20001
16 20100
17 20130

About Edward Engbrecht

Edward Engbrecht is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering, Mechanics of Materials, Atomic and Molecular Physics, and Optics and Hardware and Architecture, having authored 17 papers that have together received 334 indexed citations. Recurring topics across this work include Semiconductor materials and devices (11 papers), Copper Interconnects and Reliability (8 papers), Metal and Thin Film Mechanics (6 papers), Semiconductor materials and interfaces (4 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), 3D IC and TSV technologies (3 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers) and Diamond and Carbon-based Materials Research (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (278 citations), Hardware and Architecture (26 citations), Electronic, Optical and Magnetic Materials (50 citations), Mechanics of Materials (63 citations) and Materials Chemistry (79 citations). Edward Engbrecht has collaborated with scholars based in United States, Germany and Bulgaria. Frequent co-authors include John Gilbert Ekerdt, Yong Sun, J.M. White, John White, Klaus Pfeifer, Juan G. Lozano, Stephen Decatur Smith, Joe Bennett, James M. White and Tibor Bolom. Their work appears in journals such as Thin Solid Films, Journal of materials research/Pratt's guide to venture capital sources, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, IBM Journal of Research and Development and ECS Transactions.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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