E. Rije
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Ferroelectric and Negative Capacitance Devices
- Integrated Circuits and Semiconductor Failure Analysis
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- Semiconductor materials and interfaces
Papers in
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- Semiconductor materials and devices 7
- Ferroelectric and Negative Capacitance Devices 4
- Silicon and Solar Cell Technologies 3
- Integrated Circuits and Semiconductor Failure Analysis 2
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- Electronic and Structural Properties of Oxides 4
- Ferroelectric and Piezoelectric Materials 3
- Co-authors
- S. Mantl (5 shared papers)U. Breuer (3 shared papers)St. Lenk (3 shared papers)Qing‐Tai Zhao (3 shared papers)Rainer Waser (5 shared papers)M. Roeckerath (4 shared papers)H. Kohlstedt (2 shared papers)Timothy J. Reece (2 shared papers)
- Journals
- Applied Physics Letters (4 papers)Journal of Applied Physics (2 papers)Journal of The Electrochemical Society (2 papers)Microelectronic Engineering (1 paper)Applied Surface Science (1 paper)
- Partner nations
- GermanyBelgiumUnited States
In The Last Decade
E. Rije
12 papers receiving 354 citations
Peers
Comparison fields: 5 of 26
- Electrical and Electronic Engineering 312
- Atomic and Molecular Physics, and Optics 127
- Materials Chemistry 165
- Electronic, Optical and Magnetic Materials 39
- Biomedical Engineering 75
Countries citing papers authored by E. Rije
This map shows the geographic impact of E. Rije's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Rije with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Rije more than expected).
Fields of papers citing papers by E. Rije
This network shows the impact of papers produced by E. Rije. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Rije. The network helps show where E. Rije may publish in the future.
Co-authors
The 25 scholars most cited alongside E. Rije, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2005 | 114 | |
| 2 | 2006 | 71 | |
| 3 | 2006 | 45 | |
| 4 | 2006 | 39 | |
| 5 | 2007 | 27 | |
| 6 | 2010 | 24 | |
| 7 | 2007 | 20 | |
| 8 | 2005 | 11 | |
| 9 | 2004 | 11 | |
| 10 | 2004 | 4 | |
| 11 | 2008 | 2 | |
| 12 | 2008 | 2 |
About E. Rije
E. Rije is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics, Biomedical Engineering and Electronic, Optical and Magnetic Materials, having authored 12 papers that have together received 370 indexed citations. Recurring topics across this work include Semiconductor materials and devices (7 papers), Ferroelectric and Negative Capacitance Devices (4 papers), Electronic and Structural Properties of Oxides (4 papers), Semiconductor materials and interfaces (4 papers), Ferroelectric and Piezoelectric Materials (3 papers), Silicon and Solar Cell Technologies (3 papers), Advanced Sensor and Energy Harvesting Materials (3 papers) and Integrated Circuits and Semiconductor Failure Analysis (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (312 citations), Atomic and Molecular Physics, and Optics (127 citations), Materials Chemistry (165 citations), Electronic, Optical and Magnetic Materials (39 citations) and Biomedical Engineering (75 citations). E. Rije has collaborated with scholars based in Germany, Belgium and United States. Frequent co-authors include S. Mantl, U. Breuer, St. Lenk, Qing‐Tai Zhao, Rainer Waser, M. Roeckerath, H. Kohlstedt, Timothy J. Reece, Andreas Gerber and Stephen Ducharme. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, Journal of The Electrochemical Society, Microelectronic Engineering and Applied Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.