Dan Perry

631 citations
13 papers · 94 · h-index 6

Impact in

    • 3D IC and TSV technologies
    • Electronic Packaging and Soldering Technologies
    • Integrated Circuits and Semiconductor Failure Analysis
    • Semiconductor materials and devices
    • Thin-Film Transistor Technologies
    • Advancements in Photolithography Techniques
    • Advancements in Semiconductor Devices and Circuit Design

Papers in

    • 3D IC and TSV technologies 7
    • Electronic Packaging and Soldering Technologies 4
    • Advancements in Photolithography Techniques 3
    • Integrated Circuits and Semiconductor Failure Analysis 3
    • Engineering Structural Analysis Methods 3
    • Mechanical Failure Analysis and Simulation 2

Dan Perry

12 papers receiving 88 citations

Peers

Dan Perry
Comparison fields: 5 of 13
  • Hardware and Architecture 14
  • Electrical and Electronic Engineering 87
  • Automotive Engineering 12
  • Computer Networks and Communications 9
  • Biomedical Engineering 15
Replace Jiefeng Lin with:
Jiefeng Lin China
A. Andreini Italy
G. Hatcher United States
P. Galbiati Italy
M. Weybright United States
Martin Ostermayr Germany
Damien Croain France
C. Contiero Italy
Surej Ravikumar United States
Hun-Hsien Chang Taiwan
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Citations per field
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Jiefeng Lin · 1×
Citations per year

Countries citing papers authored by Dan Perry

Since Specialization
Citations

This map shows the geographic impact of Dan Perry's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Dan Perry with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Dan Perry more than expected).

Fields of papers citing papers by Dan Perry

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Dan Perry. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Dan Perry. The network helps show where Dan Perry may publish in the future.

Co-authors

The 25 scholars most cited alongside Dan Perry, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Dan Perry Line = papers co-authored together Dan Perry links everyone, so they are left out of the graph.

All Works

13 of 13 papers shown
#Work
1 201021
2 201220
3 201015
4 200410
5 20106
6 20126
7 20074
8 20094
9 20114
10 20142
11 19771
12 19751
13 19750

About Dan Perry

Dan Perry is a scholar working on Electrical and Electronic Engineering, Mechanical Engineering, Hardware and Architecture, Biomedical Engineering and Automotive Engineering, having authored 13 papers that have together received 94 indexed citations. Recurring topics across this work include 3D IC and TSV technologies (7 papers), Electronic Packaging and Soldering Technologies (4 papers), Advancements in Photolithography Techniques (3 papers), Engineering Structural Analysis Methods (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), VLSI and Analog Circuit Testing (3 papers), Mechanical Failure Analysis and Simulation (2 papers) and Mechanical stress and fatigue analysis (1 paper). The work is most often cited by research in Hardware and Architecture (14 citations), Electrical and Electronic Engineering (87 citations), Automotive Engineering (12 citations), Computer Networks and Communications (9 citations) and Biomedical Engineering (15 citations). Dan Perry has collaborated with scholars based in Belgium, United Kingdom and United States. Frequent co-authors include Guruprasad Katti, Wim Dehaene, Michele Stucchi, Dimitrios Velenis, Raymond J. McKenzie, Vladimir Cherman, Herman Oprins, C. Torregiani, Michał Rakowski and Geert Van der Plas. Their work appears in journals such as IEEE Transactions on Semiconductor Manufacturing, IEEE Solid-State Circuits Magazine, The Journal of Strain Analysis for Engineering Design, Journal of Strain Analysis and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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