Cyrus E. Tabery
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
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- Advancements in Semiconductor Devices and Circuit Design
- Semiconductor materials and devices
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Low-power high-performance VLSI design
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 11
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- Industrial Vision Systems and Defect Detection 14
- Co-authors
- Qian Xiang (2 shared papers)David F. Kyser (1 shared paper)Tsu-Jae King (1 shared paper)Leland Chang (1 shared paper)Suzanne O. Bell (1 shared paper)Jeffrey Bokor (1 shared paper)Ming-Ren Lin (1 shared paper)Chenming Hu (1 shared paper)
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (1 paper)Journal of The Electrochemical Society (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (29 papers)Journal of Micro/Nanopatterning Materials and Metrology (3 papers)
- Partner nations
- United StatesNetherlandsBelgium
In The Last Decade
Cyrus E. Tabery
44 papers receiving 723 citations
Cyrus E. Tabery's Hit Papers
Peers
Comparison fields: 5 of 34
- Surfaces, Coatings and Films 92
- Electrical and Electronic Engineering 739
- Industrial and Manufacturing Engineering 56
- Hardware and Architecture 32
- Biomedical Engineering 139
Countries citing papers authored by Cyrus E. Tabery
This map shows the geographic impact of Cyrus E. Tabery's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Cyrus E. Tabery with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Cyrus E. Tabery more than expected).
Fields of papers citing papers by Cyrus E. Tabery
This network shows the impact of papers produced by Cyrus E. Tabery. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Cyrus E. Tabery. The network helps show where Cyrus E. Tabery may publish in the future.
Co-authors
The 25 scholars most cited alongside Cyrus E. Tabery, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 52 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | FinFET scaling to 10 nm gate length Hit paper breakdown → | 2003 | 482 |
| 2 | 2008 | 38 | |
| 3 | 2007 | 27 | |
| 4 | 2006 | 23 | |
| 5 | 2020 | 18 | |
| 6 | 2010 | 18 | |
| 7 | 2007 | 14 | |
| 8 | 2011 | 14 | |
| 9 | 2008 | 12 | |
| 10 | 2005 | 11 | |
| 11 | 2008 | 10 | |
| 12 | 2005 | 10 | |
| 13 | 2009 | 9 | |
| 14 | 2006 | 9 | |
| 15 | 2003 | 9 | |
| 16 | 2005 | 8 | |
| 17 | 2010 | 7 | |
| 18 | 2009 | 6 | |
| 19 | 2001 | 6 | |
| 20 | 2009 | 5 |
About Cyrus E. Tabery
Cyrus E. Tabery is a scholar working on Surfaces, Coatings and Films, Industrial and Manufacturing Engineering, Electrical and Electronic Engineering, Biomedical Engineering and Mechanical Engineering, having authored 52 papers that have together received 777 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (46 papers), Industrial Vision Systems and Defect Detection (14 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers), Electron and X-Ray Spectroscopy Techniques (11 papers), Advanced Surface Polishing Techniques (8 papers), Advanced optical system design (6 papers), Nanofabrication and Lithography Techniques (6 papers) and Advanced Measurement and Metrology Techniques (5 papers). The work is most often cited by research in Surfaces, Coatings and Films (92 citations), Electrical and Electronic Engineering (739 citations), Industrial and Manufacturing Engineering (56 citations), Hardware and Architecture (32 citations) and Biomedical Engineering (139 citations). Cyrus E. Tabery has collaborated with scholars based in United States, Netherlands and Belgium. Frequent co-authors include Qian Xiang, David F. Kyser, Tsu-Jae King, Leland Chang, Suzanne O. Bell, Jeffrey Bokor, Ming-Ren Lin, Chenming Hu, Haihong Wang and Safayet Ahmed. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Journal of The Electrochemical Society, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE and Journal of Micro/Nanopatterning Materials and Metrology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.