Bruce W. Smith
Impact in
- Surfaces, Coatings and Films top 1%
- Optical Coatings and Gratings
- Electron and X-Ray Spectroscopy Techniques
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- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
Papers in
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- Advancements in Photolithography Techniques 112
- Integrated Circuits and Semiconductor Failure Analysis 34
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- Optical Coatings and Gratings 36
- Electron and X-Ray Spectroscopy Techniques 32
- Co-authors
- Neal Lafferty (18 shared papers)Kazuaki Suzuki (3 shared papers)Paul Zimmerman (8 shared papers)Peng Xie (5 shared papers)John J. McManus (1 shared paper)Evan L. Schwartz (2 shared papers)Christopher K. Ober (3 shared papers)Emmanuel P. Giannelis (3 shared papers)
- Journals
- Journal of Micro/Nanolithography MEMS and MOEMS (7 papers)Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (6 papers)Chemistry of Materials (2 papers)IEEE Transactions on Plasma Science (2 papers)Microelectronic Engineering (2 papers)
- Partner nations
- United StatesBelgiumUnited Kingdom
In The Last Decade
Bruce W. Smith
141 papers receiving 943 citations
Peers
Comparison fields: 5 of 98
- Surfaces, Coatings and Films 368
- Electrical and Electronic Engineering 779
- Media Technology 114
- Radiation 114
- Biomedical Engineering 421
Countries citing papers authored by Bruce W. Smith
This map shows the geographic impact of Bruce W. Smith's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bruce W. Smith with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bruce W. Smith more than expected).
Fields of papers citing papers by Bruce W. Smith
This network shows the impact of papers produced by Bruce W. Smith. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bruce W. Smith. The network helps show where Bruce W. Smith may publish in the future.
Co-authors
The 25 scholars most cited alongside Bruce W. Smith, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 155 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2011 | 53 | |
| 2 | 2010 | 52 | |
| 3 | 2002 | 32 | |
| 4 | 2010 | 31 | |
| 5 | 1975 | 30 | |
| 6 | 2006 | 28 | |
| 7 | 2010 | 24 | |
| 8 | 2000 | 23 | |
| 9 | 2007 | 23 | |
| 10 | 2004 | 21 | |
| 11 | 2012 | 20 | |
| 12 | 1993 | 20 | |
| 13 | 1997 | 19 | |
| 14 | 2014 | 18 | |
| 15 | 2005 | 17 | |
| 16 | 2009 | 17 | |
| 17 | 2020 | 16 | |
| 18 | 2004 | 15 | |
| 19 | 2005 | 15 | |
| 20 | 2000 | 14 |
About Bruce W. Smith
Bruce W. Smith is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering, Media Technology and Radiation, having authored 155 papers that have together received 1.0k indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (112 papers), Optical Coatings and Gratings (36 papers), Integrated Circuits and Semiconductor Failure Analysis (34 papers), Electron and X-Ray Spectroscopy Techniques (32 papers), Nanofabrication and Lithography Techniques (21 papers), Advanced X-ray Imaging Techniques (17 papers), Advanced optical system design (17 papers) and Advanced Surface Polishing Techniques (15 papers). The work is most often cited by research in Surfaces, Coatings and Films (368 citations), Electrical and Electronic Engineering (779 citations), Media Technology (114 citations), Radiation (114 citations) and Biomedical Engineering (421 citations). Bruce W. Smith has collaborated with scholars based in United States, Belgium and United Kingdom. Frequent co-authors include Neal Lafferty, Kazuaki Suzuki, Paul Zimmerman, Peng Xie, John J. McManus, Evan L. Schwartz, Christopher K. Ober, Emmanuel P. Giannelis, Markos Trikeriotis and Joost Bekaert. Their work appears in journals such as Journal of Micro/Nanolithography MEMS and MOEMS, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Chemistry of Materials, IEEE Transactions on Plasma Science and Microelectronic Engineering.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.