Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena

3.8k papers and 33.0k indexed citations i.

About

The 3.8k papers published in Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena in the last decades have received a total of 33.0k indexed citations. Papers published in Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena usually cover Electrical and Electronic Engineering (2.5k papers), Materials Chemistry (1.4k papers) and Biomedical Engineering (1.1k papers) specifically the topics of Semiconductor materials and devices (1.0k papers), Advancements in Photolithography Techniques (439 papers) and Integrated Circuits and Semiconductor Failure Analysis (372 papers). The most active scholars publishing in Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena are S. J. Pearton, F. Ren, Lorenzo Mangolini, B. N. Kurdi, Geoffrey W. Burr, Rohit S. Shenoy, Alvaro Padilla, G. S. Oehrlein, Jihyun Kim and K. Jagannadham.

In The Last Decade

Fields of papers published in Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers published in Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers published in Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena.

Countries where authors publish in Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena

Since Specialization

Citations

This map shows the geographic impact of research published in Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers published in Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena more than expected).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar’s output or impact.

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