Tom Oder

935 citations
30 papers · 827 · h-index 12

Impact in

Papers in

Tom Oder

30 papers receiving 808 citations

Peers

Tom Oder
Comparison fields: 5 of 34
  • Condensed Matter Physics 504
  • Surfaces, Coatings and Films 120
  • Electronic, Optical and Magnetic Materials 286
  • Atomic and Molecular Physics, and Optics 344
  • Electrical and Electronic Engineering 367
Replace Feng Yun with:
Feng Yun China
L.S. Tan Singapore
Jong Hyeob Baek South Korea
Tsung‐Ting Kao United States
M. Hong Taiwan
Zhiting Lin China
S. B. Thapa Germany
Vladimir Matias United States
David S. Meyaard United States
C. H. Kuo Taiwan
Tom Oder relative to Feng Yun China Feng Yun's profile →
Citations per field
00.5×1.5×1.8×
Feng Yun · 1×
Citations per year

Countries citing papers authored by Tom Oder

Since Specialization
Citations

This map shows the geographic impact of Tom Oder's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Tom Oder with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Tom Oder more than expected).

Fields of papers citing papers by Tom Oder

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Tom Oder. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Tom Oder. The network helps show where Tom Oder may publish in the future.

Co-authors

The 25 scholars most cited alongside Tom Oder, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Tom Oder Line = papers co-authored together Tom Oder links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 30 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2004289
2 2002145
3 2003119
4 200339
5 200037
6 202131
7 200723
8 199821
9 200618
10 199817
11 200116
12 200111
13 20099
14 20138
15 20098
16 20178
17 20005
18 19984
19 20144
20
Characterization of Ultraviolet ZnO Photodetector
20192

About Tom Oder

Tom Oder is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Condensed Matter Physics, Biomedical Engineering and Materials Chemistry, having authored 30 papers that have together received 827 indexed citations. Recurring topics across this work include GaN-based semiconductor devices and materials (13 papers), Semiconductor materials and devices (11 papers), Silicon Carbide Semiconductor Technologies (10 papers), Semiconductor materials and interfaces (10 papers), ZnO doping and properties (5 papers), Photonic Crystals and Applications (5 papers), Optical Coatings and Gratings (4 papers) and Semiconductor Quantum Structures and Devices (4 papers). The work is most often cited by research in Condensed Matter Physics (504 citations), Surfaces, Coatings and Films (120 citations), Electronic, Optical and Magnetic Materials (286 citations), Atomic and Molecular Physics, and Optics (344 citations) and Electrical and Electronic Engineering (367 citations). Tom Oder has collaborated with scholars based in United States and Taiwan. Frequent co-authors include H. X. Jiang, J. Y. Lin, Jagat Shakya, J. Li, M. L. Nakarmi, John R. Williams, Tamara Isaacs‐Smith, J. Crofton, P. Martin and Suzanne E. Mohney. Their work appears in journals such as Applied Physics Letters, Journal of Electronic Materials, AIP Advances, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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