Tom Blomberg

743 citations
30 papers · 377 · h-index 12

Impact in

Papers in

Tom Blomberg

30 papers receiving 359 citations

Peers

Tom Blomberg
Comparison fields: 5 of 47
  • Geochemistry and Petrology 28
  • Materials Chemistry 212
  • Electrical and Electronic Engineering 249
  • Electronic, Optical and Magnetic Materials 55
  • Biomedical Engineering 92
Replace Hongxiang Deng with:
Hongxiang Deng China
Yuanping Chen United States
Qingyun Sun China
Ian Kerr United Kingdom
Y. Matsui Japan
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Citations per field
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Citations per year

Countries citing papers authored by Tom Blomberg

Since Specialization
Citations

This map shows the geographic impact of Tom Blomberg's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Tom Blomberg with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Tom Blomberg more than expected).

Fields of papers citing papers by Tom Blomberg

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Tom Blomberg. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Tom Blomberg. The network helps show where Tom Blomberg may publish in the future.

Co-authors

The 25 scholars most cited alongside Tom Blomberg, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Tom Blomberg Line = papers co-authored together Tom Blomberg links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 30 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200698
2 200840
3 201029
4 200624
5 200416
6 202113
7 201113
8 201312
9 201212
10 201112
11 201912
12 200711
13 20129
14 20128
15
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20078
16 20148
17 20128
18 20126
19 20116
20 20125

About Tom Blomberg

Tom Blomberg is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Electronic, Optical and Magnetic Materials, Mechanics of Materials and Biomedical Engineering, having authored 30 papers that have together received 377 indexed citations. Recurring topics across this work include Semiconductor materials and devices (18 papers), Ferroelectric and Negative Capacitance Devices (9 papers), Copper Interconnects and Reliability (7 papers), Ferroelectric and Piezoelectric Materials (6 papers), Metal and Thin Film Mechanics (5 papers), Electronic and Structural Properties of Oxides (5 papers), Thermochemical Biomass Conversion Processes (5 papers) and Thermal and Kinetic Analysis (3 papers). The work is most often cited by research in Geochemistry and Petrology (28 citations), Materials Chemistry (212 citations), Electrical and Electronic Engineering (249 citations), Electronic, Optical and Magnetic Materials (55 citations) and Biomedical Engineering (92 citations). Tom Blomberg has collaborated with scholars based in Germany, United States and Finland. Frequent co-authors include Suvi Haukka, S. Marcus, Kai‐Erik Elers, Brad Aitchison, Christian Wenger, G. Ruhl, Mindaugas Lukosius, Matti Hiltunen, P. K. Baumann and T. S. Tripathi. Their work appears in journals such as Thin Solid Films, Microelectronic Engineering, Materials and Corrosion, ECS Journal of Solid State Science and Technology and Applied Surface Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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