Thomas Abell

640 citations
19 papers · 530 · h-index 7

Impact in

Papers in

Thomas Abell

18 papers receiving 516 citations

Peers

Thomas Abell
Comparison fields: 5 of 31
  • Electronic, Optical and Magnetic Materials 290
  • Ceramics and Composites 57
  • Polymers and Plastics 107
  • Mechanics of Materials 134
  • Electrical and Electronic Engineering 309
Replace David M. Gage with:
David M. Gage United States
Wen-Fa Wu Taiwan
D. Knoesen South Africa
Haruo Yokomichi Japan
Sa‐Kyun Rha South Korea
Valérie Bouquet France
L. V. Yakovkina Russia
H. T. Langhammer Germany
Ashok M. Mahajan India
Quentin Simon France
Thomas Abell relative to David M. Gage United States David M. Gage's profile →
Citations per field
00.5×7.3×
David M. Gage · 1×
Citations per year

Countries citing papers authored by Thomas Abell

Since Specialization
Citations

This map shows the geographic impact of Thomas Abell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas Abell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas Abell more than expected).

Fields of papers citing papers by Thomas Abell

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Thomas Abell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas Abell. The network helps show where Thomas Abell may publish in the future.

Co-authors

The 25 scholars most cited alongside Thomas Abell, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Thomas Abell Line = papers co-authored together Thomas Abell links everyone, so they are left out of the graph.

All Works

19 of 19 papers shown
#Work
1 2004319
2 2006108
3 200427
4 200518
5 200515
6 20039
7 20058
8 20055
9 20034
10 20063
11 20053
12 20042
13
Interface characterization of nanoscale laminate structures on dense dielectric substrates by x-ray reflectivity
20052
14 20032
15
Comparison of modulus and density measurements by nanoidentation, SAWS, XRR and EP techniques of a porous low k MSQ dielectric
20052
16
Precursor penetration and sealing for CVD SiCOH low k dielectric during atomic layer deposition of WCN barrier
20021
17
Correlation between solvent diffusion, porosity and pore sealing for low k dielectrics
20031
18 20051
19 20250

About Thomas Abell

Thomas Abell is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering, Mechanics of Materials, Biomedical Engineering and Materials Chemistry, having authored 19 papers that have together received 530 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (17 papers), Semiconductor materials and devices (14 papers), Metal and Thin Film Mechanics (9 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers), Acoustic Wave Resonator Technologies (1 paper), Muon and positron interactions and applications (1 paper), Electron and X-Ray Spectroscopy Techniques (1 paper) and Anodic Oxide Films and Nanostructures (1 paper). The work is most often cited by research in Electronic, Optical and Magnetic Materials (290 citations), Ceramics and Composites (57 citations), Polymers and Plastics (107 citations), Mechanics of Materials (134 citations) and Electrical and Electronic Engineering (309 citations). Thomas Abell has collaborated with scholars based in Belgium, United States and Netherlands. Frequent co-authors include Karen Maex, Francesca Iacopi, Denis Shamiryan, Youssef Travaly, Piet J. Grobet, Kristof Houthoofd, Reinhold H. Dauskardt, Timo Sajavaara, Carlo Waldfried and B. Eyckens. Their work appears in journals such as Microelectronic Engineering, Journal of Applied Physics, Frontiers in Psychiatry, Materials Today and MRS Proceedings.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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