Stephan Müllender
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
- Optical Coatings and Gratings
- Radiation top 10%
- X-ray Spectroscopy and Fluorescence Analysis
- Advanced X-ray Imaging Techniques
Papers in
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- Optical Coatings and Gratings 7
- Electron and X-Ray Spectroscopy Techniques 4
-
- Advanced X-ray Imaging Techniques 3
- X-ray Spectroscopy and Fluorescence Analysis 3
- Co-authors
- Fred Bijkerk (13 shared papers)E. Zoethout (12 shared papers)Robbert Wilhelmus Elisabeth van de Kruijs (7 shared papers)Eric Louis (6 shared papers)Andrei M. Yakunin (4 shared papers)Igor A. Makhotkin (4 shared papers)Andrey Yakshin (6 shared papers)E. Louis (7 shared papers)
- Journals
- Optics Express (2 papers)Thin Solid Films (2 papers)Applied Surface Science (1 paper)Journal of Micro/Nanolithography MEMS and MOEMS (1 paper)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (1 paper)
- Partner nations
- GermanyNetherlandsFrance
In The Last Decade
Stephan Müllender
23 papers receiving 307 citations
Peers
Comparison fields: 5 of 34
- Surfaces, Coatings and Films 97
- Radiation 110
- Condensed Matter Physics 42
- Computational Mechanics 74
- Atomic and Molecular Physics, and Optics 82
Countries citing papers authored by Stephan Müllender
This map shows the geographic impact of Stephan Müllender's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Stephan Müllender with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Stephan Müllender more than expected).
Fields of papers citing papers by Stephan Müllender
This network shows the impact of papers produced by Stephan Müllender. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Stephan Müllender. The network helps show where Stephan Müllender may publish in the future.
Co-authors
The 25 scholars most cited alongside Stephan Müllender, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 23 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1996 | 56 | |
| 2 | 2013 | 46 | |
| 3 | 2007 | 36 | |
| 4 | 2012 | 29 | |
| 5 | 2006 | 26 | |
| 6 | 2001 | 26 | |
| 7 | 2009 | 14 | |
| 8 | 2003 | 13 | |
| 9 | 2012 | 13 | |
| 10 | 2010 | 11 | |
| 11 | 2008 | 11 | |
| 12 | 2006 | 8 | |
| 13 | 2005 | 6 | |
| 14 | 2010 | 6 | |
| 15 | 2005 | 5 | |
| 16 | 2006 | 5 | |
| 17 | 2020 | 4 | |
| 18 | 1997 | 4 | |
| 19 | 2007 | 2 | |
| 20 | 2008 | 1 |
About Stephan Müllender
Stephan Müllender is a scholar working on Surfaces, Coatings and Films, Radiation, Electrical and Electronic Engineering, Condensed Matter Physics and Biomedical Engineering, having authored 23 papers that have together received 325 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (8 papers), Optical Coatings and Gratings (7 papers), Advanced Surface Polishing Techniques (5 papers), Diamond and Carbon-based Materials Research (4 papers), Electron and X-Ray Spectroscopy Techniques (4 papers), Metal and Thin Film Mechanics (4 papers), Advanced X-ray Imaging Techniques (3 papers) and X-ray Spectroscopy and Fluorescence Analysis (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (97 citations), Radiation (110 citations), Condensed Matter Physics (42 citations), Computational Mechanics (74 citations) and Atomic and Molecular Physics, and Optics (82 citations). Stephan Müllender has collaborated with scholars based in Germany, Netherlands and France. Frequent co-authors include Fred Bijkerk, E. Zoethout, Robbert Wilhelmus Elisabeth van de Kruijs, Eric Louis, Andrei M. Yakunin, Igor A. Makhotkin, Andrey Yakshin, E. Louis, Paul W. Loeffen and J. Röhler. Their work appears in journals such as Optics Express, Thin Solid Films, Applied Surface Science, Journal of Micro/Nanolithography MEMS and MOEMS and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.