S. Abermann

821 citations
39 papers · 686 · h-index 16

Impact in

Papers in

    • Semiconductor materials and devices 31
    • Advancements in Semiconductor Devices and Circuit Design 10
    • Ferroelectric and Negative Capacitance Devices 8
    • Integrated Circuits and Semiconductor Failure Analysis 6
    • Advanced Memory and Neural Computing 5
    • Electronic and Structural Properties of Oxides 9

S. Abermann

39 papers receiving 664 citations

Peers

S. Abermann
Comparison fields: 5 of 42
  • Condensed Matter Physics 162
  • Electrical and Electronic Engineering 545
  • Materials Chemistry 368
  • Electronic, Optical and Magnetic Materials 122
  • Atomic and Molecular Physics, and Optics 124
Replace J. Kumar with:
J. Kumar India
Eda Goldenberg Türkiye
Yuheng Zhang China
Hwansoo Suh South Korea
Mingzeng Peng China
Bo Ling Singapore
R. Rimet France
Ming‐Kwei Lee Taiwan
C. T. Wu Taiwan
Osamu Omoto Japan
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Citations per field
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Citations per year

Countries citing papers authored by S. Abermann

Since Specialization
Citations

This map shows the geographic impact of S. Abermann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Abermann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Abermann more than expected).

Fields of papers citing papers by S. Abermann

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Abermann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Abermann. The network helps show where S. Abermann may publish in the future.

Co-authors

The 25 scholars most cited alongside S. Abermann, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S. Abermann Line = papers co-authored together S. Abermann links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 39 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2013111
2 200886
3 200761
4 201356
5 200934
6 200932
7 201125
8 201324
9 201223
10 201021
11 201020
12 201018
13 201018
14 200318
15 201017
16 200916
17 201015
18 200914
19 201411
20 20078

About S. Abermann

S. Abermann is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics and Condensed Matter Physics, having authored 39 papers that have together received 686 indexed citations. Recurring topics across this work include Semiconductor materials and devices (31 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers), Electronic and Structural Properties of Oxides (9 papers), Copper Interconnects and Reliability (9 papers), Ferroelectric and Negative Capacitance Devices (8 papers), Semiconductor materials and interfaces (7 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers) and Advanced Memory and Neural Computing (5 papers). The work is most often cited by research in Condensed Matter Physics (162 citations), Electrical and Electronic Engineering (545 citations), Materials Chemistry (368 citations), Electronic, Optical and Magnetic Materials (122 citations) and Atomic and Molecular Physics, and Optics (124 citations). S. Abermann has collaborated with scholars based in Austria, Switzerland and Germany. Frequent co-authors include E. Bertagnolli, Ole Bethge, Christoph Henkel, G. Pozzovivo, G. Strasser, D. Pogány, N. Grandjean, J. Kuzmı́k, Emil List and Théodoros Dimopoulos. Their work appears in journals such as Microelectronic Engineering, Applied Physics Letters, Journal of The Electrochemical Society, Applied Surface Science and IEEE Transactions on Electron Devices.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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