P.K. Tan
Impact in
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- Phase-change materials and chalcogenides
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- Chalcogenide Semiconductor Thin Films
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Memory and Neural Computing
- Semiconductor materials and devices
Papers in
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- Integrated Circuits and Semiconductor Failure Analysis 33
- Semiconductor materials and devices 16
- Chalcogenide Semiconductor Thin Films 10
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- Phase-change materials and chalcogenides 17
- Co-authors
- Tow Chong Chong (16 shared papers)Rong Zhao (8 shared papers)Luping Shi (11 shared papers)Anyan Du (1 shared paper)Xiangshui Miao (11 shared papers)Xiangshui Miao (6 shared papers)Jeffrey Lam (20 shared papers)Lu Shi (6 shared papers)
- Journals
- Japanese Journal of Applied Physics (11 papers)Microelectronics Reliability (7 papers)Journal of Applied Physics (5 papers)Applied Physics Letters (1 paper)IEEE Transactions on Device and Materials Reliability (1 paper)
- Partner nations
- SingaporeUnited States
In The Last Decade
P.K. Tan
48 papers receiving 472 citations
Peers
Comparison fields: 5 of 33
- Materials Chemistry 334
- Electrical and Electronic Engineering 403
- Polymers and Plastics 75
- Electronic, Optical and Magnetic Materials 87
- Biomedical Engineering 115
Countries citing papers authored by P.K. Tan
This map shows the geographic impact of P.K. Tan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P.K. Tan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P.K. Tan more than expected).
Fields of papers citing papers by P.K. Tan
This network shows the impact of papers produced by P.K. Tan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P.K. Tan. The network helps show where P.K. Tan may publish in the future.
Co-authors
The 25 scholars most cited alongside P.K. Tan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 55 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2006 | 213 | |
| 2 | 2006 | 42 | |
| 3 | 1999 | 31 | |
| 4 | 2005 | 18 | |
| 5 | 2008 | 18 | |
| 6 | 2002 | 15 | |
| 7 | 2002 | 15 | |
| 8 | 2017 | 7 | |
| 9 | 2007 | 7 | |
| 10 | 2003 | 7 | |
| 11 | 2015 | 7 | |
| 12 | 2014 | 7 | |
| 13 | 2018 | 7 | |
| 14 | 2015 | 7 | |
| 15 | 2000 | 6 | |
| 16 | 2013 | 5 | |
| 17 | 2002 | 5 | |
| 18 | 2001 | 5 | |
| 19 | 2015 | 4 | |
| 20 | 2004 | 4 |
About P.K. Tan
P.K. Tan is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Biomedical Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films, having authored 55 papers that have together received 483 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (33 papers), Phase-change materials and chalcogenides (17 papers), Semiconductor materials and devices (16 papers), Electron and X-Ray Spectroscopy Techniques (11 papers), Chalcogenide Semiconductor Thin Films (10 papers), Liquid Crystal Research Advancements (9 papers), Force Microscopy Techniques and Applications (8 papers) and Near-Field Optical Microscopy (7 papers). The work is most often cited by research in Materials Chemistry (334 citations), Electrical and Electronic Engineering (403 citations), Polymers and Plastics (75 citations), Electronic, Optical and Magnetic Materials (87 citations) and Biomedical Engineering (115 citations). P.K. Tan has collaborated with scholars based in Singapore and United States. Frequent co-authors include Tow Chong Chong, Rong Zhao, Luping Shi, Anyan Du, Xiangshui Miao, Xiangshui Miao, Jeffrey Lam, Lu Shi, H. Tan and Kian Guan Lim. Their work appears in journals such as Japanese Journal of Applied Physics, Microelectronics Reliability, Journal of Applied Physics, Applied Physics Letters and IEEE Transactions on Device and Materials Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.