Jeffrey Lam
Impact in
- Structural Biology top 10%
- Hardware and Architecture top 10%
- VLSI and Analog Circuit Testing
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 58
- Semiconductor materials and devices 24
-
- Advanced Surface Polishing Techniques 9
- Co-authors
- Zhihong Mai (31 shared papers)P.K. Tan (20 shared papers)S.L. Toh (12 shared papers)M. K. Dawood (9 shared papers)L. C. Hsia (5 shared papers)H. Tan (13 shared papers)Handong Sun (3 shared papers)Zexiang Shen (3 shared papers)
- Journals
- Microelectronics Reliability (4 papers)AIP Advances (3 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (3 papers)Applied Physics Letters (1 paper)Review of Scientific Instruments (1 paper)
- Partner nations
- SingaporeUnited StatesGermany
In The Last Decade
Jeffrey Lam
64 papers receiving 249 citations
Peers
Comparison fields: 5 of 43
- Structural Biology 13
- Hardware and Architecture 35
- Electrical and Electronic Engineering 195
- Surfaces, Coatings and Films 21
- Atomic and Molecular Physics, and Optics 78
Countries citing papers authored by Jeffrey Lam
This map shows the geographic impact of Jeffrey Lam's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jeffrey Lam with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jeffrey Lam more than expected).
Fields of papers citing papers by Jeffrey Lam
This network shows the impact of papers produced by Jeffrey Lam. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jeffrey Lam. The network helps show where Jeffrey Lam may publish in the future.
Co-authors
The 25 scholars most cited alongside Jeffrey Lam, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 76 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2013 | 25 | |
| 2 | 2014 | 18 | |
| 3 | 2008 | 18 | |
| 4 | 2011 | 14 | |
| 5 | 2018 | 12 | |
| 6 | 2009 | 12 | |
| 7 | 2018 | 11 | |
| 8 | 2017 | 7 | |
| 9 | 2007 | 7 | |
| 10 | 2015 | 7 | |
| 11 | 2014 | 7 | |
| 12 | 2015 | 7 | |
| 13 | 2012 | 5 | |
| 14 | 2013 | 5 | |
| 15 | 2018 | 5 | |
| 16 | 2012 | 4 | |
| 17 | 2017 | 4 | |
| 18 | 2018 | 4 | |
| 19 | 2022 | 4 | |
| 20 | 2006 | 4 |
About Jeffrey Lam
Jeffrey Lam is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics and Hardware and Architecture, having authored 76 papers that have together received 265 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (58 papers), Semiconductor materials and devices (24 papers), Electron and X-Ray Spectroscopy Techniques (17 papers), VLSI and Analog Circuit Testing (13 papers), Ion-surface interactions and analysis (11 papers), Force Microscopy Techniques and Applications (10 papers), Advanced Surface Polishing Techniques (9 papers) and Industrial Vision Systems and Defect Detection (9 papers). The work is most often cited by research in Structural Biology (13 citations), Hardware and Architecture (35 citations), Electrical and Electronic Engineering (195 citations), Surfaces, Coatings and Films (21 citations) and Atomic and Molecular Physics, and Optics (78 citations). Jeffrey Lam has collaborated with scholars based in Singapore, United States and Germany. Frequent co-authors include Zhihong Mai, P.K. Tan, S.L. Toh, M. K. Dawood, L. C. Hsia, H. Tan, Handong Sun, Zexiang Shen, Hao Tan and Qiyun Deng. Their work appears in journals such as Microelectronics Reliability, AIP Advances, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Applied Physics Letters and Review of Scientific Instruments.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.