Ming‐Dou Ker

6.6k citations

458 papers · 5.1k · h-index 31

Impact in

Electrical and Electronic Engineering top 0.5%
- Electrostatic Discharge in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Electromagnetic Compatibility and Noise Suppression
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Silicon Carbide Semiconductor Technologies
Hardware and Architecture top 5%

Papers in

Electrical and Electronic Engineering 439
- Electrostatic Discharge in Electronics 367
- Integrated Circuits and Semiconductor Failure Analysis 255
- Electromagnetic Compatibility and Noise Suppression 230
- Semiconductor materials and devices 122
- Advancements in Semiconductor Devices and Circuit Design 59
Hardware and Architecture 29
- Physical Unclonable Functions (PUFs) and Hardware Security 26

Co-authors: Chun‐Yu Lin (47 shared papers)Chung‐Yu Wu (30 shared papers)Jung‐Sheng Chen (10 shared papers)Zhicong Luo (8 shared papers)Wenyi Chen (15 shared papers)Chih-Ting Yeh (15 shared papers)Shih‐Lun Chen (8 shared papers)Chun-Hua Tsai (1 shared paper)
Journals: IEEE Transactions on Electron Devices (53 papers)IEEE Transactions on Device and Materials Reliability (34 papers)Microelectronics Reliability (25 papers)IEEE Journal of Solid-State Circuits (19 papers)IEEE Electron Device Letters (8 papers)
Partner nations: Taiwan United States Belgium

In The Last Decade

Ming‐Dou Ker

440 papers receiving 4.9k citations

Peers

Countries citing papers authored by Ming‐Dou Ker

Since Specialization

Citations

This map shows the geographic impact of Ming‐Dou Ker's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ming‐Dou Ker with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ming‐Dou Ker more than expected).

Fields of papers citing papers by Ming‐Dou Ker

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ming‐Dou Ker. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ming‐Dou Ker. The network helps show where Ming‐Dou Ker may publish in the future.

Co-authors

The 25 scholars most cited alongside Ming‐Dou Ker, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Ming‐Dou Ker Line = papers co-authored together Ming‐Dou Ker links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 458 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Whole-chip ESD protection design with efficient VDD-to-VSS ESD clamp circuits for submicron CMOS VLSI IEEE Transactions on Electron Devices ·Ming‐Dou Ker	1999	249
2	Design of Charge Pump Circuit With Consideration of Gate-Oxide Reliability in Low-Voltage CMOS Processes IEEE Journal of Solid-State Circuits ·Ming‐Dou Ker, S.-L. Chen, Chun-Hua Tsai	2006	167
3	A Fully Integrated 16-Channel Closed-Loop Neural-Prosthetic CMOS SoC With Wireless Power and Bidirectional Data Telemetry for Real-Time Efficient Human Epileptic Seizure Control IEEE Journal of Solid-State Circuits ·Cheng-Hsiang Cheng, Ping-Yuan Tsai, Tzu-Yi Yang, Wan-Hsueh Cheng, Ting-Yang Yen, Zhicong Luo, Xin-Hong Qian, Zhixin Chen	2018	121
4	New Curvature-Compensation Technique for CMOS Bandgap Reference With Sub-1-V Operation IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing ·Ming‐Dou Ker, Jung‐Sheng Chen	2006	84
5	Investigation of the gate-driven effect and substrate-triggered effect on ESD robustness of CMOS devices IEEE Transactions on Device and Materials Reliability ·Tung-Yang Chen, Ming‐Dou Ker	2001	72
6	A High-Voltage-Tolerant and Precise Charge-Balanced Neuro-Stimulator in Low Voltage CMOS Process IEEE Transactions on Biomedical Circuits and Systems ·Zhicong Luo, Ming‐Dou Ker	2016	65
7	A gate-coupled PTLSCR/NTLSCR ESD protection circuit for deep-submicron low-voltage CMOS ICs IEEE Journal of Solid-State Circuits ·Ming‐Dou Ker, Hun-Hsien Chang, Chung‐Yu Wu	1997	59
8	Overview on ESD Protection Designs of Low-Parasitic Capacitance for RF ICs in CMOS Technologies IEEE Transactions on Device and Materials Reliability ·Ming‐Dou Ker, Chun‐Yu Lin, Yuan‐Wen Hsiao	2011	54
9	ESD protection design on analog pin with very low input capacitance for high-frequency or current-mode applications IEEE Journal of Solid-State Circuits ·Ming‐Dou Ker, Tung-Yang Chen, Chung‐Yu Wu, Hun Hsien Chang	2000	52
10	Methodology on extracting compact layout rules for latchup prevention in deep-submicron bulk CMOS technology IEEE Transactions on Semiconductor Manufacturing ·Ming‐Dou Ker, Wen-Yu Lo	2003	50
11	Capacitor-couple ESD protection circuit for deep-submicron low-voltage CMOS ASIC IEEE Transactions on Very Large Scale Integration (VLSI) Systems ·Ming‐Dou Ker, Chung‐Yu Wu, Cheng Tao, Hun-Hsien Chang	1996	50
12	Physical Mechanism and Device Simulation on Transient-Induced Latchup in CMOS ICs Under System-Level ESD Test IEEE Transactions on Electron Devices ·Ming‐Dou Ker, S.-F. Hsu	2005	49
13	Transient‐Induced Latchup in CMOS Integrated Circuits CERN Document Server (European Organization for Nuclear Research) ·Ming‐Dou Ker, Sheng‐Fu Hsu	2009	48
14	Overview and Design of Mixed-Voltage I/O Buffers With Low-Voltage Thin-Oxide CMOS Transistors IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications ·Ming‐Dou Ker, S.-L. Chen, Chia-Sheng Tsai	2006	45
15	Component-Level Measurement for Transient-Induced Latch-up in CMOS ICs Under System-Level ESD Considerations IEEE Transactions on Device and Materials Reliability ·Ming‐Dou Ker, S.-F. Hsu	2006	44
16	Investigation and Design of On-Chip Power-Rail ESD Clamp Circuits Without Suffering Latchup-Like Failure During System-Level ESD Test IEEE Journal of Solid-State Circuits ·Ming‐Dou Ker, Cheng-Cheng Yen	2008	44
17	A new Schmitt trigger circuit in a 0.13-/spl mu/m 1/2.5-V CMOS process to receive 3.3-V input signals IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing ·Shih‐Lun Chen, Ming‐Dou Ker	2005	44
18	Latchup-free esd protection design with complementary substrate-triggered scr devices IEEE Journal of Solid-State Circuits ·Ming‐Dou Ker, Kuo-Chun Hsu	2003	39
19	The impact of low-holding-voltage issue in high-voltage CMOS technology and the design of latchup-free power-rail ESD clamp circuit for LCD driver ICs IEEE Journal of Solid-State Circuits ·Ming‐Dou Ker, Kun-Hsien Lin	2005	38
20	New Curvature-Compensation Technique for CMOS Bandgap Reference with Sub-1-V Operation Ming‐Dou Ker, Jung‐Sheng Chen, Ching-Yun Chu	2005	38

About Ming‐Dou Ker

Ming‐Dou Ker is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Cellular and Molecular Neuroscience, Biomedical Engineering and Cognitive Neuroscience, having authored 458 papers that have together received 5.1k indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (367 papers), Integrated Circuits and Semiconductor Failure Analysis (255 papers), Electromagnetic Compatibility and Noise Suppression (230 papers), Semiconductor materials and devices (122 papers), Advancements in Semiconductor Devices and Circuit Design (59 papers), Neuroscience and Neural Engineering (34 papers), Analog and Mixed-Signal Circuit Design (30 papers) and Physical Unclonable Functions (PUFs) and Hardware Security (26 papers). The work is most often cited by research in Electrical and Electronic Engineering (4.7k citations), Hardware and Architecture (233 citations), Cellular and Molecular Neuroscience (448 citations), Biomedical Engineering (736 citations) and Cognitive Neuroscience (267 citations). Ming‐Dou Ker has collaborated with scholars based in Taiwan, United States and Belgium. Frequent co-authors include Chun‐Yu Lin, Chung‐Yu Wu, Jung‐Sheng Chen, Zhicong Luo, Wenyi Chen, Chih-Ting Yeh, Shih‐Lun Chen, Chun-Hua Tsai, Hun-Hsien Chang and Kun-Hsien Lin. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Transactions on Device and Materials Reliability, Microelectronics Reliability, IEEE Journal of Solid-State Circuits and IEEE Electron Device Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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