Max J. Schulz

1.3k citations
27 papers · 1.0k · h-index 11

Impact in

    • Semiconductor materials and devices
    • Silicon Carbide Semiconductor Technologies
    • Advancements in Semiconductor Devices and Circuit Design
    • Thin-Film Transistor Technologies
    • Integrated Circuits and Semiconductor Failure Analysis

Papers in

Max J. Schulz

25 papers receiving 977 citations

Peers

Max J. Schulz
Comparison fields: 5 of 58
  • Electrical and Electronic Engineering 894
  • Ceramics and Composites 64
  • Atomic and Molecular Physics, and Optics 320
  • Electronic, Optical and Magnetic Materials 110
  • Materials Chemistry 248
Replace Bok Hyeon Kim with:
Bok Hyeon Kim South Korea
M. Suzuki Japan
D.J. Dumin United States
David E. Kotecki United States
Guillaume Vienne China
Clarence J. Tracy United States
N. Healy United Kingdom
M. Offenberg Germany
Seung‐Bo Shim South Korea
Zhaohong Han United States
Max J. Schulz relative to Bok Hyeon Kim South Korea Bok Hyeon Kim's profile →
Citations per field
00.5×1.5×
Bok Hyeon Kim · 1×
Citations per year

Countries citing papers authored by Max J. Schulz

Since Specialization
Citations

This map shows the geographic impact of Max J. Schulz's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Max J. Schulz with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Max J. Schulz more than expected).

Fields of papers citing papers by Max J. Schulz

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Max J. Schulz. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Max J. Schulz. The network helps show where Max J. Schulz may publish in the future.

Co-authors

The 25 scholars most cited alongside Max J. Schulz, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Max J. Schulz Line = papers co-authored together Max J. Schulz links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 27 papers — load more, or switch the sort, to bring in the rest.

#Work
1 1999249
2 1996221
3 1976138
4 2000116
5 1996104
6 199932
7 199729
8 199121
9 197820
10 199517
11 199517
12 198010
13 20016
14 20006
15 19905
16 20025
17 19975
18 20093
19 19993
20 19983

About Max J. Schulz

Max J. Schulz is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Aerospace Engineering, Mechanics of Materials and Materials Chemistry, having authored 27 papers that have together received 1.0k indexed citations. Recurring topics across this work include Semiconductor materials and devices (11 papers), Silicon Carbide Semiconductor Technologies (7 papers), Infrared Target Detection Methodologies (6 papers), Semiconductor materials and interfaces (6 papers), Thermography and Photoacoustic Techniques (5 papers), Silicon and Solar Cell Technologies (5 papers), Calibration and Measurement Techniques (4 papers) and Thin-Film Transistor Technologies (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (894 citations), Ceramics and Composites (64 citations), Atomic and Molecular Physics, and Optics (320 citations), Electronic, Optical and Magnetic Materials (110 citations) and Materials Chemistry (248 citations). Max J. Schulz has collaborated with scholars based in Germany, Belgium and United States. Frequent co-authors include Gerhard Pensl, M. Baßler, V. V. Afanas’ev, E. Klausmann, A. Goetzberger, E. Stein von Kamienski, A. Stesmans, V. V. Afanas’ev, Chris I. Harris and Wolfgang A. Cabanski. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, IEEE Transactions on Electron Devices, Microelectronic Engineering and Physical Review B.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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