M. Falke
Impact in
- Structural Biology top 2%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Semiconductor materials and interfaces 22
- Surface and Thin Film Phenomena 17
-
- Semiconductor materials and devices 9
- Co-authors
- S. Teichert (16 shared papers)Andrew Bleloch (12 shared papers)H.‐J. Hinneberg (16 shared papers)G. Beddies (18 shared papers)Karl Leo (1 shared paper)Sebastian Reineke (1 shared paper)Karsten Walzer (1 shared paper)Gregor Schwartz (1 shared paper)
- Journals
- Microscopy and Microanalysis (17 papers)Applied Physics Letters (9 papers)Microelectronic Engineering (6 papers)Applied Surface Science (3 papers)Journal of Applied Physics (2 papers)
- Partner nations
- GermanyUnited KingdomUnited States
In The Last Decade
M. Falke
56 papers receiving 726 citations
Peers
Comparison fields: 5 of 56
- Structural Biology 113
- Surfaces, Coatings and Films 118
- Materials Chemistry 377
- Atomic and Molecular Physics, and Optics 230
- Electrical and Electronic Engineering 314
Countries citing papers authored by M. Falke
This map shows the geographic impact of M. Falke's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Falke with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Falke more than expected).
Fields of papers citing papers by M. Falke
This network shows the impact of papers produced by M. Falke. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Falke. The network helps show where M. Falke may publish in the future.
Co-authors
The 25 scholars most cited alongside M. Falke, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 57 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2009 | 94 | |
| 2 | 2012 | 80 | |
| 3 | 2003 | 70 | |
| 4 | 2009 | 62 | |
| 5 | 2004 | 42 | |
| 6 | 2001 | 38 | |
| 7 | 2009 | 33 | |
| 8 | 2006 | 32 | |
| 9 | 2006 | 30 | |
| 10 | 2005 | 20 | |
| 11 | 2006 | 19 | |
| 12 | 2001 | 17 | |
| 13 | 2002 | 15 | |
| 14 | 2006 | 15 | |
| 15 | 1997 | 15 | |
| 16 | 2016 | 13 | |
| 17 | 2017 | 12 | |
| 18 | 2001 | 11 | |
| 19 | 2000 | 11 | |
| 20 | 2002 | 10 |
About M. Falke
M. Falke is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Surfaces, Coatings and Films, Structural Biology and Materials Chemistry, having authored 57 papers that have together received 743 indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (22 papers), Electron and X-Ray Spectroscopy Techniques (19 papers), Surface and Thin Film Phenomena (17 papers), Advanced Electron Microscopy Techniques and Applications (12 papers), Semiconductor materials and devices (9 papers), Iron oxide chemistry and applications (5 papers), Ion-surface interactions and analysis (5 papers) and Advanced Materials Characterization Techniques (5 papers). The work is most often cited by research in Structural Biology (113 citations), Surfaces, Coatings and Films (118 citations), Materials Chemistry (377 citations), Atomic and Molecular Physics, and Optics (230 citations) and Electrical and Electronic Engineering (314 citations). M. Falke has collaborated with scholars based in Germany, United Kingdom and United States. Frequent co-authors include S. Teichert, Andrew Bleloch, H.‐J. Hinneberg, G. Beddies, Karl Leo, Sebastian Reineke, Karsten Walzer, Gregor Schwartz, U. Falke and Ch. Kleint. Their work appears in journals such as Microscopy and Microanalysis, Applied Physics Letters, Microelectronic Engineering, Applied Surface Science and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.